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Identifying passivated dynamic force microscopy tips on H:Si(100)

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  • Peter Sharp
  • Samuel Jarvis
  • Richard Woolley
  • Adam Sweetman
  • Lev Kantorovich
  • Chris Pakes
  • Philip Moriarty
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Article number233120
<mark>Journal publication date</mark>4/06/2012
<mark>Journal</mark>Applied Physics Letters
Issue number23
Volume100
Number of pages4
Publication StatusPublished
<mark>Original language</mark>English

Abstract

The chemical reactivity of the tip plays a central role in image formation in dynamic force microscopy, but in very many cases the state of the probe is a key experimental unknown. We show here that an H-terminated and thus chemically unreactive tip can be readily identified via characteristic imaging and spectroscopic (F(z)) signatures, including, in particular, contrast inversion, on hydrogen-passivated Si(100). We determine the tip apex termination by comparing site-specific difference force curves with the results of density functional theory, providing a clear protocol for the identification of chemically unreactive tips on silicon surfaces.