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Mechanochemistry at silicon surfaces

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Publication date19/05/2015
Host publicationNoncontact Atomic Force Microscopy
EditorsSeizo Morita, Franz J. Giessibl, Ernst Meyer, Roland Wiesendanger
PublisherSpringer Verlag
Pages247-274
Number of pages28
ISBN (electronic)9783319155883
ISBN (print)9783319358765, 9783319155876
<mark>Original language</mark>English

Publication series

NameNanoScience and Technology
PublisherSpringer Verlag
ISSN (Print)1434-4904
ISSN (electronic)2197-7127

Abstract

Non-contact atomic force microscopy has driven the development of a variety of exciting chemomechanical protocols for manipulating metal, semiconductor, and insulating surfaces at the single chemical bond limit. In this chapter we discuss atomic manipulation on silicon surfaces via mechanical force alone (mechanochemistry), with a particular focus on a prototype of a mechanicallyactuated atomic switch: the flipping of bi-stable dimers on the Si(100)–c(4 × 2) surface. The importance of the mutual orientation of electronic orbitals in the dimer manipulation process is explored in the broader context of the mechanochemical modification of covalently bonded semiconductors. In addition, variations in surface reactivity play a key role in the ability to generate (and image) atomic-scale modifications and we discuss experimental and theoretical work on H:Si(100) as an exemplar of a passivated and chemically inert substrate, as compared to the relatively high reactivity of the unpassivated Si(100) surface.