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Model for chaotic dielectric microresonators.

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Model for chaotic dielectric microresonators. / Keating, J. P.; Novaes, M.; Schomerus, Henning.
In: Physical review a, Vol. 77, 31.01.2008, p. 013834.

Research output: Contribution to Journal/Magazine › Journal article › peer-review

Harvard

Keating, JP, Novaes, M & Schomerus, H 2008, 'Model for chaotic dielectric microresonators.', Physical review a, vol. 77, pp. 013834. https://doi.org/10.1103/PhysRevA.77.013834

APA

Keating, J. P., Novaes, M., & Schomerus, H. (2008). Model for chaotic dielectric microresonators. Physical review a, 77, 013834. https://doi.org/10.1103/PhysRevA.77.013834

Vancouver

Keating JP, Novaes M, Schomerus H. Model for chaotic dielectric microresonators. Physical review a. 2008 Jan 31;77:013834. doi: 10.1103/PhysRevA.77.013834

Author

Keating, J. P. ; Novaes, M. ; Schomerus, Henning. / Model for chaotic dielectric microresonators. In: Physical review a. 2008 ; Vol. 77. pp. 013834.

Bibtex

@article{22eddab363354aa99c9476bcee746a5f,
title = "Model for chaotic dielectric microresonators.",
abstract = "We develop a random-matrix model of two-dimensional dielectric resonators which combines internal wave chaos with the deterministic Fresnel laws for reflection and refraction at the interfaces. The model is used to investigate the statistics of the laser threshold and linewidth (lifetime and Petermann factor of the resonances) when the resonator is filled with an active medium. The laser threshold decreases for increasing refractive index n and is smaller for TM polarization than for TE polarization, but is almost independent of the number of out-coupling modes N. The Petermann factor in the linewidth of the longest-living resonance also decreases for increasing n and scales as sqrt(N), but is less sensitive to polarization. For resonances of intermediate lifetime, the Petermann factor scales linearly with N. These qualitative parametric dependencies are consistent with the random-matrix theory of resonators with small openings. However, for a small refractive index where the resonators are very open, the details of the statistics become nonuniversal. This is demonstrated by comparison with a particular dynamical model.",
author = "Keating, {J. P.} and M. Novaes and Henning Schomerus",
note = "{\textcopyright} 2008 American Physical Society.",
year = "2008",
month = jan,
day = "31",
doi = "10.1103/PhysRevA.77.013834",
language = "English",
volume = "77",
pages = "013834",
journal = "Physical review a",
issn = "1050-2947",
publisher = "American Physical Society",

}

RIS

TY - JOUR

T1 - Model for chaotic dielectric microresonators.

AU - Keating, J. P.

AU - Novaes, M.

AU - Schomerus, Henning

N1 - © 2008 American Physical Society.

PY - 2008/1/31

Y1 - 2008/1/31

N2 - We develop a random-matrix model of two-dimensional dielectric resonators which combines internal wave chaos with the deterministic Fresnel laws for reflection and refraction at the interfaces. The model is used to investigate the statistics of the laser threshold and linewidth (lifetime and Petermann factor of the resonances) when the resonator is filled with an active medium. The laser threshold decreases for increasing refractive index n and is smaller for TM polarization than for TE polarization, but is almost independent of the number of out-coupling modes N. The Petermann factor in the linewidth of the longest-living resonance also decreases for increasing n and scales as sqrt(N), but is less sensitive to polarization. For resonances of intermediate lifetime, the Petermann factor scales linearly with N. These qualitative parametric dependencies are consistent with the random-matrix theory of resonators with small openings. However, for a small refractive index where the resonators are very open, the details of the statistics become nonuniversal. This is demonstrated by comparison with a particular dynamical model.

AB - We develop a random-matrix model of two-dimensional dielectric resonators which combines internal wave chaos with the deterministic Fresnel laws for reflection and refraction at the interfaces. The model is used to investigate the statistics of the laser threshold and linewidth (lifetime and Petermann factor of the resonances) when the resonator is filled with an active medium. The laser threshold decreases for increasing refractive index n and is smaller for TM polarization than for TE polarization, but is almost independent of the number of out-coupling modes N. The Petermann factor in the linewidth of the longest-living resonance also decreases for increasing n and scales as sqrt(N), but is less sensitive to polarization. For resonances of intermediate lifetime, the Petermann factor scales linearly with N. These qualitative parametric dependencies are consistent with the random-matrix theory of resonators with small openings. However, for a small refractive index where the resonators are very open, the details of the statistics become nonuniversal. This is demonstrated by comparison with a particular dynamical model.

U2 - 10.1103/PhysRevA.77.013834

DO - 10.1103/PhysRevA.77.013834

M3 - Journal article

VL - 77

SP - 013834

JO - Physical review a

JF - Physical review a

SN - 1050-2947

ER -