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Open Circuit Voltages for PERC Local Back Surface Fields Directly Resolved at the Nanoscale: 46th IEEE Photovoltaic Specialists Conference, PVSC 2019

Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review

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Open Circuit Voltages for PERC Local Back Surface Fields Directly Resolved at the Nanoscale: 46th IEEE Photovoltaic Specialists Conference, PVSC 2019. / Longacre, A.; Martin, M.; Kolosov, O.V. et al.
2019. 817-821.

Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review

Harvard

Longacre, A, Martin, M, Kolosov, OV, Schneller, E, Curran, AJ, Wang, M, Dai, J, Bruckman, LS, Jaubert, J-N, Davis, KO, Braid, JL, French, RH & Huey, BD 2019, 'Open Circuit Voltages for PERC Local Back Surface Fields Directly Resolved at the Nanoscale: 46th IEEE Photovoltaic Specialists Conference, PVSC 2019', pp. 817-821. https://doi.org/10.1109/PVSC40753.2019.8980910

APA

Longacre, A., Martin, M., Kolosov, O. V., Schneller, E., Curran, A. J., Wang, M., Dai, J., Bruckman, L. S., Jaubert, J.-N., Davis, K. O., Braid, J. L., French, R. H., & Huey, B. D. (2019). Open Circuit Voltages for PERC Local Back Surface Fields Directly Resolved at the Nanoscale: 46th IEEE Photovoltaic Specialists Conference, PVSC 2019. 817-821. https://doi.org/10.1109/PVSC40753.2019.8980910

Vancouver

Longacre A, Martin M, Kolosov OV, Schneller E, Curran AJ, Wang M et al.. Open Circuit Voltages for PERC Local Back Surface Fields Directly Resolved at the Nanoscale: 46th IEEE Photovoltaic Specialists Conference, PVSC 2019. 2019. doi: 10.1109/PVSC40753.2019.8980910

Author

Longacre, A. ; Martin, M. ; Kolosov, O.V. et al. / Open Circuit Voltages for PERC Local Back Surface Fields Directly Resolved at the Nanoscale : 46th IEEE Photovoltaic Specialists Conference, PVSC 2019. 5 p.

Bibtex

@conference{5e9b55f017194fac9fd8f82c23c7c319,
title = "Open Circuit Voltages for PERC Local Back Surface Fields Directly Resolved at the Nanoscale: 46th IEEE Photovoltaic Specialists Conference, PVSC 2019",
abstract = "The open circuit voltage is a critical indicator of solar cell performance and degradation. At the often-critical nanoscale, however, V OC detection is much more challenging, due to practical limitations on spatial resolution, voltage resolution, and/or measurement times. Accordingly, a new Atomic Force Microscopy based approach is described for directly imaging the local V OC. This is demonstrated with cross-sectioned monocrystalline PERC cells around the entire circumference of a poly-Si via. The V OC maps reveal 1-3 μm of uniform Al in-diffusion throughout this local Back Surface Field. Such high spatial resolution methods for photovoltaic performance mapping are especially promising for identifying markers of degradation in silicon and other solar cell technologies. ",
keywords = "Atomic Force Microscopy, diffusion processes, photovoltaic effects, solar panels, Atomic force microscopy, Image resolution, Nanotechnology, Open circuit voltage, Photovoltaic effects, Silicon compounds, Solar power generation, Timing circuits, Diffusion process, High spatial resolution, Local back surface fields, Photovoltaic performance, Solar cell performance, Solar cell technology, Solar panels, Spatial resolution, Solar cells",
author = "A. Longacre and M. Martin and O.V. Kolosov and E. Schneller and A.J. Curran and M. Wang and J. Dai and L.S. Bruckman and J.-N. Jaubert and K.O. Davis and J.L. Braid and R.H. French and B.D. Huey",
note = "Conference code: 157434 Export Date: 26 March 2020 CODEN: CRCND Funding details: Solar Energy Technologies Office, SETO, DE-EE-0008172 Funding details: U.S. Department of Energy, USDOE Funding details: Office of Energy Efficiency and Renewable Energy, EERE Funding text 1: This material is based upon work supported by the U.S. Department of Energy{\textquoteright}s Office of Energy Efficiency and Renewable Energy (EERE) under Solar Energy Technologies Office (SETO) Agreement Number DE-EE-0008172. The DuPont Silicon Valley Technology Center is recognized for fabricating the investigated monocrystalline PERC cells. References: Tennyson, E.M., Garrett, J.L., Frantz, J.A., Myers, J.D., Bekele, R.Y., Sanghera, J.S., Munday, J.N., Leite, M.S., Nanoimaging of open -circuit voltage in photovoltaic devices (2015) Advanced Energy Materials, 5 (23), p. 1501142; Glatzel, T., Fuertes Marr{\'o}n, D., Schedel-Niedrig, T., Sadewasser, S., Lux-Steiner, M.C., Cugase2 solar cell cross section studied by kelvin probe force microscopy in ultrahigh vacuum (2002) Applied Physics Letters, 81 (11); Kutes, Y., Aguirre, B.A., Bosse, J.L., Cruz-Campa, J.L., Zubia, D., Huey, B.D., Mapping photovoltaic performance with nanoscale resolution (2016) Progress in Photovoltaics, 24 (3), pp. 315-325; Atamanuk, K., Luria, J., Huey, B.D., Direct afm-based nanoscale mapping and tomography of open-circuit voltages for photovoltaics (2018) Beilstein J. Nanotechnol., 9, pp. 1802-1808; Kutes, Y., Zhou, Y., Bosse, J.L., Steffes, J., Padture, N.P., Huey, B.D., Mapping the photoresponse of ch3nh3pbi3 hybrid perovskite thin films at the nanoscale (2016) NanoLetters, 16 (6), pp. 3434-3441; French, R.H., Murray, M.P., Lin, W., Shell, K.A., Brown, S.A., Schuetz, M.A., Davis, R.J., Solar radiation durability of materials components and systems for low concentration photovoltaic systems (2011) Energytech, , IEEE, Cleveland, 2011; Ahn, N., Kwak, K., Jang, M., Yoon, H., Lee, B., Lee, J.-K., Pikhitsa, P., Choi, M., Trapped charge-driven degradation of perovskite solar cells (2016) Nature Communications, 7; Kraft, A., Labusch, L., Ensslen, T., D{\"u}rr, I., Bartsch, J., Glatthaar, M., Glunz, S., Reinecke, H., Investigation of acetic acid corrosion impact on printed solar cell contacts (2015) IEEE Journal of Photovoltaics, 5 (3), pp. 736-743; Badiee, A., Ashcroft, I.A., Wildman, R.D., The thermomechanical degradation of ethylene vinyl acetate used as a solar panel adhesive and encapsulant (2016) Science Direct, 68, pp. 212-218; Pern, F.J., Czanderna, A.W., Characterization of ethylene vinyl acetate (eva) encapsulant: Effects of thermal processing and weathering degradation on its discoloration (1992) Science Direct, 25 (1), pp. 3-23; Luria, J., Kutes, Y., Moore, A., Zhang, L., Stach, E., Huey, B., Charge transport in cdte solar cells revealed by conductive tomographic atomic force microscopy (2016) Nature Energy, 1; Leite, M., Abasin, M., Lezec, H., Gianfrancesco, A., Talin, A., Zhitenev, N., Nanoscale imaging of photocurrent and efficiency in cdte solar cells (2014) ACS Nano, 8 (11), pp. 11883-11890; Sadewasser, S., Abou-Ras, D., Azulay, D., Baier, R., Balberg, I., Cahen, D., Cohen, S., Unold, T., Nanometer-scale electronic and microstructural properties of grain boundaries in cu(in, ga)se2 (2011) Thin Solid Films, 519 (21), pp. 7341-7346; Visoly-Fisher, I., Cohen, S., Gartsman, K., Ruzin, A., Cahen, D., Understanding the beneficial role of grain boundaries inpolycrystalline solar cells from single-grain-boundary scanningprobe microscopy (2006) Advanced Functional Materials, 16 (5), pp. 649-660; Li, J., Chawla, V., Clemens, B., Investigating the role of grain boundaries in czts and cztsse thin film solar cells with scanning probe microscopy (2012) Advanced Materials, 24 (6), pp. 720-723; Galloway, S., Edwards, P., Durose, K., Characterisation of thin film cds/cdte solar cells using electron and optical beam induced current (1999) Solar Energy Materials and Solar Cells, 57 (1), pp. 61-74",
year = "2019",
month = jun,
day = "30",
doi = "10.1109/PVSC40753.2019.8980910",
language = "English",
pages = "817--821",

}

RIS

TY - CONF

T1 - Open Circuit Voltages for PERC Local Back Surface Fields Directly Resolved at the Nanoscale

T2 - 46th IEEE Photovoltaic Specialists Conference, PVSC 2019

AU - Longacre, A.

AU - Martin, M.

AU - Kolosov, O.V.

AU - Schneller, E.

AU - Curran, A.J.

AU - Wang, M.

AU - Dai, J.

AU - Bruckman, L.S.

AU - Jaubert, J.-N.

AU - Davis, K.O.

AU - Braid, J.L.

AU - French, R.H.

AU - Huey, B.D.

N1 - Conference code: 157434 Export Date: 26 March 2020 CODEN: CRCND Funding details: Solar Energy Technologies Office, SETO, DE-EE-0008172 Funding details: U.S. Department of Energy, USDOE Funding details: Office of Energy Efficiency and Renewable Energy, EERE Funding text 1: This material is based upon work supported by the U.S. Department of Energy’s Office of Energy Efficiency and Renewable Energy (EERE) under Solar Energy Technologies Office (SETO) Agreement Number DE-EE-0008172. The DuPont Silicon Valley Technology Center is recognized for fabricating the investigated monocrystalline PERC cells. References: Tennyson, E.M., Garrett, J.L., Frantz, J.A., Myers, J.D., Bekele, R.Y., Sanghera, J.S., Munday, J.N., Leite, M.S., Nanoimaging of open -circuit voltage in photovoltaic devices (2015) Advanced Energy Materials, 5 (23), p. 1501142; Glatzel, T., Fuertes Marrón, D., Schedel-Niedrig, T., Sadewasser, S., Lux-Steiner, M.C., Cugase2 solar cell cross section studied by kelvin probe force microscopy in ultrahigh vacuum (2002) Applied Physics Letters, 81 (11); Kutes, Y., Aguirre, B.A., Bosse, J.L., Cruz-Campa, J.L., Zubia, D., Huey, B.D., Mapping photovoltaic performance with nanoscale resolution (2016) Progress in Photovoltaics, 24 (3), pp. 315-325; Atamanuk, K., Luria, J., Huey, B.D., Direct afm-based nanoscale mapping and tomography of open-circuit voltages for photovoltaics (2018) Beilstein J. Nanotechnol., 9, pp. 1802-1808; Kutes, Y., Zhou, Y., Bosse, J.L., Steffes, J., Padture, N.P., Huey, B.D., Mapping the photoresponse of ch3nh3pbi3 hybrid perovskite thin films at the nanoscale (2016) NanoLetters, 16 (6), pp. 3434-3441; French, R.H., Murray, M.P., Lin, W., Shell, K.A., Brown, S.A., Schuetz, M.A., Davis, R.J., Solar radiation durability of materials components and systems for low concentration photovoltaic systems (2011) Energytech, , IEEE, Cleveland, 2011; Ahn, N., Kwak, K., Jang, M., Yoon, H., Lee, B., Lee, J.-K., Pikhitsa, P., Choi, M., Trapped charge-driven degradation of perovskite solar cells (2016) Nature Communications, 7; Kraft, A., Labusch, L., Ensslen, T., Dürr, I., Bartsch, J., Glatthaar, M., Glunz, S., Reinecke, H., Investigation of acetic acid corrosion impact on printed solar cell contacts (2015) IEEE Journal of Photovoltaics, 5 (3), pp. 736-743; Badiee, A., Ashcroft, I.A., Wildman, R.D., The thermomechanical degradation of ethylene vinyl acetate used as a solar panel adhesive and encapsulant (2016) Science Direct, 68, pp. 212-218; Pern, F.J., Czanderna, A.W., Characterization of ethylene vinyl acetate (eva) encapsulant: Effects of thermal processing and weathering degradation on its discoloration (1992) Science Direct, 25 (1), pp. 3-23; Luria, J., Kutes, Y., Moore, A., Zhang, L., Stach, E., Huey, B., Charge transport in cdte solar cells revealed by conductive tomographic atomic force microscopy (2016) Nature Energy, 1; Leite, M., Abasin, M., Lezec, H., Gianfrancesco, A., Talin, A., Zhitenev, N., Nanoscale imaging of photocurrent and efficiency in cdte solar cells (2014) ACS Nano, 8 (11), pp. 11883-11890; Sadewasser, S., Abou-Ras, D., Azulay, D., Baier, R., Balberg, I., Cahen, D., Cohen, S., Unold, T., Nanometer-scale electronic and microstructural properties of grain boundaries in cu(in, ga)se2 (2011) Thin Solid Films, 519 (21), pp. 7341-7346; Visoly-Fisher, I., Cohen, S., Gartsman, K., Ruzin, A., Cahen, D., Understanding the beneficial role of grain boundaries inpolycrystalline solar cells from single-grain-boundary scanningprobe microscopy (2006) Advanced Functional Materials, 16 (5), pp. 649-660; Li, J., Chawla, V., Clemens, B., Investigating the role of grain boundaries in czts and cztsse thin film solar cells with scanning probe microscopy (2012) Advanced Materials, 24 (6), pp. 720-723; Galloway, S., Edwards, P., Durose, K., Characterisation of thin film cds/cdte solar cells using electron and optical beam induced current (1999) Solar Energy Materials and Solar Cells, 57 (1), pp. 61-74

PY - 2019/6/30

Y1 - 2019/6/30

N2 - The open circuit voltage is a critical indicator of solar cell performance and degradation. At the often-critical nanoscale, however, V OC detection is much more challenging, due to practical limitations on spatial resolution, voltage resolution, and/or measurement times. Accordingly, a new Atomic Force Microscopy based approach is described for directly imaging the local V OC. This is demonstrated with cross-sectioned monocrystalline PERC cells around the entire circumference of a poly-Si via. The V OC maps reveal 1-3 μm of uniform Al in-diffusion throughout this local Back Surface Field. Such high spatial resolution methods for photovoltaic performance mapping are especially promising for identifying markers of degradation in silicon and other solar cell technologies.

AB - The open circuit voltage is a critical indicator of solar cell performance and degradation. At the often-critical nanoscale, however, V OC detection is much more challenging, due to practical limitations on spatial resolution, voltage resolution, and/or measurement times. Accordingly, a new Atomic Force Microscopy based approach is described for directly imaging the local V OC. This is demonstrated with cross-sectioned monocrystalline PERC cells around the entire circumference of a poly-Si via. The V OC maps reveal 1-3 μm of uniform Al in-diffusion throughout this local Back Surface Field. Such high spatial resolution methods for photovoltaic performance mapping are especially promising for identifying markers of degradation in silicon and other solar cell technologies.

KW - Atomic Force Microscopy

KW - diffusion processes

KW - photovoltaic effects

KW - solar panels

KW - Atomic force microscopy

KW - Image resolution

KW - Nanotechnology

KW - Open circuit voltage

KW - Photovoltaic effects

KW - Silicon compounds

KW - Solar power generation

KW - Timing circuits

KW - Diffusion process

KW - High spatial resolution

KW - Local back surface fields

KW - Photovoltaic performance

KW - Solar cell performance

KW - Solar cell technology

KW - Solar panels

KW - Spatial resolution

KW - Solar cells

U2 - 10.1109/PVSC40753.2019.8980910

DO - 10.1109/PVSC40753.2019.8980910

M3 - Conference paper

SP - 817

EP - 821

ER -