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Quantifying the local mechanical properties of twisted double bilayer graphene

Research output: Contribution to Journal/MagazineJournal articlepeer-review

  • Alessandra Canetta
  • Sergio Gonzalez-Munoz
  • Viet-Hung Nguyen
  • Khushboo Agarwal
  • Pauline de Crombrugghe de Picquendaele
  • Yuanzhuo Hong
  • Sambit Mohapatra
  • Kenji Watanabe
  • Takashi Taniguchi
  • Bernard Nysten
  • Benoît Hackens
  • Rebeca Ribeiro-Palau
  • Jean-Christophe Charlier
  • Oleg Victor Kolosov
  • Jean Spièce
  • Pascal Gehring
<mark>Journal publication date</mark>14/05/2023
Issue number18
Number of pages7
Pages (from-to)8134-8140
Publication StatusPublished
Early online date23/03/23
<mark>Original language</mark>English


Nanomechanical measurements of minimally twisted van der Waals materials remained elusive despite their fundamental importance for device realisation. Here, we use Ultrasonic Force Microscopy (UFM) to locally quantify the variation of out-of-plane Young's modulus in minimally twisted double bilayer graphene (TDBG). We reveal a softening of the Young's modulus by 7% and 17% along single and double domain walls, respectively. Our experimental results are confirmed by force-field relaxation models. This study highlights the strong tunability of nanomechanical properties in engineered twisted materials, and paves the way for future applications of designer 2D nanomechanical systems.