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Quantifying the local mechanical properties of twisted double bilayer graphene

Research output: Contribution to Journal/Magazine › Journal article › peer-review

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Quantifying the local mechanical properties of twisted double bilayer graphene. / Canetta, Alessandra; Gonzalez-Munoz, Sergio; Nguyen, Viet-Hung et al.
In: Nanoscale, Vol. 15, No. 18, 14.05.2023, p. 8134-8140.

Research output: Contribution to Journal/Magazine › Journal article › peer-review

Harvard

Canetta, A, Gonzalez-Munoz, S, Nguyen, V-H, Agarwal, K, de Crombrugghe de Picquendaele, P, Hong, Y, Mohapatra, S, Watanabe, K, Taniguchi, T, Nysten, B, Hackens, B, Ribeiro-Palau, R, Charlier, J-C, Kolosov, OV, Spièce, J & Gehring, P 2023, 'Quantifying the local mechanical properties of twisted double bilayer graphene', Nanoscale, vol. 15, no. 18, pp. 8134-8140. https://doi.org/10.1039/d3nr00388d

APA

Canetta, A., Gonzalez-Munoz, S., Nguyen, V.-H., Agarwal, K., de Crombrugghe de Picquendaele, P., Hong, Y., Mohapatra, S., Watanabe, K., Taniguchi, T., Nysten, B., Hackens, B., Ribeiro-Palau, R., Charlier, J.-C., Kolosov, O. V., Spièce, J., & Gehring, P. (2023). Quantifying the local mechanical properties of twisted double bilayer graphene. Nanoscale, 15(18), 8134-8140. https://doi.org/10.1039/d3nr00388d

Vancouver

Canetta A, Gonzalez-Munoz S, Nguyen VH, Agarwal K, de Crombrugghe de Picquendaele P, Hong Y et al. Quantifying the local mechanical properties of twisted double bilayer graphene. Nanoscale. 2023 May 14;15(18):8134-8140. Epub 2023 Mar 23. doi: 10.1039/d3nr00388d

Author

Canetta, Alessandra ; Gonzalez-Munoz, Sergio ; Nguyen, Viet-Hung et al. / Quantifying the local mechanical properties of twisted double bilayer graphene. In: Nanoscale. 2023 ; Vol. 15, No. 18. pp. 8134-8140.

Bibtex

@article{970eb2489b334dd6a628a8cb3faaee22,
title = "Quantifying the local mechanical properties of twisted double bilayer graphene",
abstract = "Nanomechanical measurements of minimally twisted van der Waals materials remained elusive despite their fundamental importance for device realisation. Here, we use Ultrasonic Force Microscopy (UFM) to locally quantify the variation of out-of-plane Young's modulus in minimally twisted double bilayer graphene (TDBG). We reveal a softening of the Young's modulus by 7% and 17% along single and double domain walls, respectively. Our experimental results are confirmed by force-field relaxation models. This study highlights the strong tunability of nanomechanical properties in engineered twisted materials, and paves the way for future applications of designer 2D nanomechanical systems.",
keywords = "General Materials Science, twisted graphene, bilayer graphene, electromechanical, nanomechanical, UFM, ultrasonic force microscopy",
author = "Alessandra Canetta and Sergio Gonzalez-Munoz and Viet-Hung Nguyen and Khushboo Agarwal and {de Crombrugghe de Picquendaele}, Pauline and Yuanzhuo Hong and Sambit Mohapatra and Kenji Watanabe and Takashi Taniguchi and Bernard Nysten and Beno{\^i}t Hackens and Rebeca Ribeiro-Palau and Jean-Christophe Charlier and Kolosov, {Oleg Victor} and Jean Spi{\`e}ce and Pascal Gehring",
year = "2023",
month = may,
day = "14",
doi = "10.1039/d3nr00388d",
language = "English",
volume = "15",
pages = "8134--8140",
journal = "Nanoscale",
issn = "2040-3364",
publisher = "Royal Society of Chemistry",
number = "18",

}

RIS

TY - JOUR

T1 - Quantifying the local mechanical properties of twisted double bilayer graphene

AU - Canetta, Alessandra

AU - Gonzalez-Munoz, Sergio

AU - Nguyen, Viet-Hung

AU - Agarwal, Khushboo

AU - de Crombrugghe de Picquendaele, Pauline

AU - Hong, Yuanzhuo

AU - Mohapatra, Sambit

AU - Watanabe, Kenji

AU - Taniguchi, Takashi

AU - Nysten, Bernard

AU - Hackens, Benoît

AU - Ribeiro-Palau, Rebeca

AU - Charlier, Jean-Christophe

AU - Kolosov, Oleg Victor

AU - Spièce, Jean

AU - Gehring, Pascal

PY - 2023/5/14

Y1 - 2023/5/14

N2 - Nanomechanical measurements of minimally twisted van der Waals materials remained elusive despite their fundamental importance for device realisation. Here, we use Ultrasonic Force Microscopy (UFM) to locally quantify the variation of out-of-plane Young's modulus in minimally twisted double bilayer graphene (TDBG). We reveal a softening of the Young's modulus by 7% and 17% along single and double domain walls, respectively. Our experimental results are confirmed by force-field relaxation models. This study highlights the strong tunability of nanomechanical properties in engineered twisted materials, and paves the way for future applications of designer 2D nanomechanical systems.

AB - Nanomechanical measurements of minimally twisted van der Waals materials remained elusive despite their fundamental importance for device realisation. Here, we use Ultrasonic Force Microscopy (UFM) to locally quantify the variation of out-of-plane Young's modulus in minimally twisted double bilayer graphene (TDBG). We reveal a softening of the Young's modulus by 7% and 17% along single and double domain walls, respectively. Our experimental results are confirmed by force-field relaxation models. This study highlights the strong tunability of nanomechanical properties in engineered twisted materials, and paves the way for future applications of designer 2D nanomechanical systems.

KW - General Materials Science

KW - twisted graphene

KW - bilayer graphene

KW - electromechanical

KW - nanomechanical

KW - UFM

KW - ultrasonic force microscopy

U2 - 10.1039/d3nr00388d

DO - 10.1039/d3nr00388d

M3 - Journal article

VL - 15

SP - 8134

EP - 8140

JO - Nanoscale

JF - Nanoscale

SN - 2040-3364

IS - 18

ER -