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Radiation testing of low cost, commercial off the shelf microcontroller board

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Radiation testing of low cost, commercial off the shelf microcontroller board. / Fried, Tomas; Di Buono, Antonio; Cheneler, David et al.
In: Nuclear Engineering and Technology, Vol. 53, No. 10, 31.10.2021, p. 3335-3343.

Research output: Contribution to Journal/MagazineJournal articlepeer-review

Harvard

Fried, T, Di Buono, A, Cheneler, D, Cockbain, N, Dodds, J, Green, PR, Lennox, B, Taylor, CJ & Monk, S 2021, 'Radiation testing of low cost, commercial off the shelf microcontroller board', Nuclear Engineering and Technology, vol. 53, no. 10, pp. 3335-3343. https://doi.org/10.1016/j.net.2021.05.005

APA

Fried, T., Di Buono, A., Cheneler, D., Cockbain, N., Dodds, J., Green, P. R., Lennox, B., Taylor, C. J., & Monk, S. (2021). Radiation testing of low cost, commercial off the shelf microcontroller board. Nuclear Engineering and Technology, 53(10), 3335-3343. https://doi.org/10.1016/j.net.2021.05.005

Vancouver

Fried T, Di Buono A, Cheneler D, Cockbain N, Dodds J, Green PR et al. Radiation testing of low cost, commercial off the shelf microcontroller board. Nuclear Engineering and Technology. 2021 Oct 31;53(10):3335-3343. Epub 2021 May 20. doi: 10.1016/j.net.2021.05.005

Author

Fried, Tomas ; Di Buono, Antonio ; Cheneler, David et al. / Radiation testing of low cost, commercial off the shelf microcontroller board. In: Nuclear Engineering and Technology. 2021 ; Vol. 53, No. 10. pp. 3335-3343.

Bibtex

@article{ffebb16510d44e0cab16854d846fd91b,
title = "Radiation testing of low cost, commercial off the shelf microcontroller board",
abstract = "The impact of gamma radiation on a commercial off the shelf microcontroller board has been investigated. Three different tests have been performed to ascertain the radiation tolerance of the device from a nuclear decommissioning deployment perspective. The first test analyses the effect of radiation on the output voltage of the on-board voltage regulator during irradiation. The second test evaluated the effect of gamma radiation on the voltage characteristics of analogue and digital inputs and outputs. The final test analyses the functionality of the microcontroller when using an external, shielded voltage regulator instead of the on-board voltage regulator. The results suggest that a series of latch-ups occurs in the microcontroller during irradiation, causing increased current drain which can damage the voltage regulator if it does not have short-circuit protection. The analogue to digital conversion functionality appears to be more sensitive to gamma radiation than digital and analogue output functionality. Using an external, shielded voltage regulator can prove beneficial when used for certain applications. The collected data suggests that detaching the voltage regulator can extend the lifespan of the platform up to approximately 350 Gy.",
keywords = "Microcontroller, Radiation Effects, Total Ionizing Dose, Nuclear Decommissioning",
author = "Tomas Fried and {Di Buono}, Antonio and David Cheneler and Neil Cockbain and Jonathan Dodds and Green, {Peter R} and Barry Lennox and Taylor, {C. James} and Stephen Monk",
year = "2021",
month = oct,
day = "31",
doi = "10.1016/j.net.2021.05.005",
language = "English",
volume = "53",
pages = "3335--3343",
journal = "Nuclear Engineering and Technology",
issn = "1738-5733",
publisher = "Korean Nuclear Society",
number = "10",

}

RIS

TY - JOUR

T1 - Radiation testing of low cost, commercial off the shelf microcontroller board

AU - Fried, Tomas

AU - Di Buono, Antonio

AU - Cheneler, David

AU - Cockbain, Neil

AU - Dodds, Jonathan

AU - Green, Peter R

AU - Lennox, Barry

AU - Taylor, C. James

AU - Monk, Stephen

PY - 2021/10/31

Y1 - 2021/10/31

N2 - The impact of gamma radiation on a commercial off the shelf microcontroller board has been investigated. Three different tests have been performed to ascertain the radiation tolerance of the device from a nuclear decommissioning deployment perspective. The first test analyses the effect of radiation on the output voltage of the on-board voltage regulator during irradiation. The second test evaluated the effect of gamma radiation on the voltage characteristics of analogue and digital inputs and outputs. The final test analyses the functionality of the microcontroller when using an external, shielded voltage regulator instead of the on-board voltage regulator. The results suggest that a series of latch-ups occurs in the microcontroller during irradiation, causing increased current drain which can damage the voltage regulator if it does not have short-circuit protection. The analogue to digital conversion functionality appears to be more sensitive to gamma radiation than digital and analogue output functionality. Using an external, shielded voltage regulator can prove beneficial when used for certain applications. The collected data suggests that detaching the voltage regulator can extend the lifespan of the platform up to approximately 350 Gy.

AB - The impact of gamma radiation on a commercial off the shelf microcontroller board has been investigated. Three different tests have been performed to ascertain the radiation tolerance of the device from a nuclear decommissioning deployment perspective. The first test analyses the effect of radiation on the output voltage of the on-board voltage regulator during irradiation. The second test evaluated the effect of gamma radiation on the voltage characteristics of analogue and digital inputs and outputs. The final test analyses the functionality of the microcontroller when using an external, shielded voltage regulator instead of the on-board voltage regulator. The results suggest that a series of latch-ups occurs in the microcontroller during irradiation, causing increased current drain which can damage the voltage regulator if it does not have short-circuit protection. The analogue to digital conversion functionality appears to be more sensitive to gamma radiation than digital and analogue output functionality. Using an external, shielded voltage regulator can prove beneficial when used for certain applications. The collected data suggests that detaching the voltage regulator can extend the lifespan of the platform up to approximately 350 Gy.

KW - Microcontroller

KW - Radiation Effects

KW - Total Ionizing Dose

KW - Nuclear Decommissioning

U2 - 10.1016/j.net.2021.05.005

DO - 10.1016/j.net.2021.05.005

M3 - Journal article

VL - 53

SP - 3335

EP - 3343

JO - Nuclear Engineering and Technology

JF - Nuclear Engineering and Technology

SN - 1738-5733

IS - 10

ER -