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Self-Shielded Topological Receiver Protectors

Research output: Contribution to Journal/Magazine › Journal article › peer-review

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Self-Shielded Topological Receiver Protectors. / Reisner, M.; Jeon, D.H.; Schindler, C. et al.
In: Physical Review Applied, Vol. 13, No. 3, 034067, 26.03.2020.

Research output: Contribution to Journal/Magazine › Journal article › peer-review

Harvard

Reisner, M, Jeon, DH, Schindler, C, Schomerus, H, Mortessagne, F, Kuhl, U & Kottos, T 2020, 'Self-Shielded Topological Receiver Protectors', Physical Review Applied, vol. 13, no. 3, 034067. https://doi.org/10.1103/PhysRevApplied.13.034067

APA

Reisner, M., Jeon, D. H., Schindler, C., Schomerus, H., Mortessagne, F., Kuhl, U., & Kottos, T. (2020). Self-Shielded Topological Receiver Protectors. Physical Review Applied, 13(3), Article 034067. https://doi.org/10.1103/PhysRevApplied.13.034067

Vancouver

Reisner M, Jeon DH, Schindler C, Schomerus H, Mortessagne F, Kuhl U et al. Self-Shielded Topological Receiver Protectors. Physical Review Applied. 2020 Mar 26;13(3):034067. doi: 10.1103/PhysRevApplied.13.034067

Author

Reisner, M. ; Jeon, D.H. ; Schindler, C. et al. / Self-Shielded Topological Receiver Protectors. In: Physical Review Applied. 2020 ; Vol. 13, No. 3.

Bibtex

@article{e1bea22cc57e4981b359397e88ddcf96,
title = "Self-Shielded Topological Receiver Protectors",
abstract = "Receiver protectors (RPs) shield sensitive electronics from high-power incoming signals that might damage them. Typical RP schemes range from simple fusing and PIN diodes to superconducting circuits and plasma cells-each having a variety of drawbacks ranging from unacceptable system downtime and self-destruction to significant insertion losses and power consumption. Here, we theoretically propose and experimentally demonstrate a unique self-shielding RP based on a coupled-resonator microwave waveguide, with a topological defect being inductively coupled to a diode. This RP utilizes a charge-conjugation-(C) symmetric resonant-defect mode that is robust against disorder and demonstrates high transmittance at low incident powers. When the incident power exceeds a critical value, a self-induced resonant trapping effect occurs, leading to a dramatic suppression of transmittance and a simultaneous increase of the reflectance close to unity. The proposed RP device is self-protected from overheating and electrical breakdown and can be utilized in radars, reflection altimeters, and a broad range of communication systems. ",
keywords = "Defects, Electromagnetic induction, Semiconductor diodes, Topology, Charge conjugation, Electrical breakdown, Inductively-coupled, Microwave waveguides, Receiver protector, Sensitive electronics, Superconducting circuit, Topological defect, Microwave resonators",
author = "M. Reisner and D.H. Jeon and C. Schindler and H. Schomerus and F. Mortessagne and U. Kuhl and T. Kottos",
note = "{\textcopyright} 2020 American Physical Society ",
year = "2020",
month = mar,
day = "26",
doi = "10.1103/PhysRevApplied.13.034067",
language = "English",
volume = "13",
journal = "Physical Review Applied",
issn = "2331-7019",
publisher = "American Physical Society",
number = "3",

}

RIS

TY - JOUR

T1 - Self-Shielded Topological Receiver Protectors

AU - Reisner, M.

AU - Jeon, D.H.

AU - Schindler, C.

AU - Schomerus, H.

AU - Mortessagne, F.

AU - Kuhl, U.

AU - Kottos, T.

N1 - © 2020 American Physical Society

PY - 2020/3/26

Y1 - 2020/3/26

N2 - Receiver protectors (RPs) shield sensitive electronics from high-power incoming signals that might damage them. Typical RP schemes range from simple fusing and PIN diodes to superconducting circuits and plasma cells-each having a variety of drawbacks ranging from unacceptable system downtime and self-destruction to significant insertion losses and power consumption. Here, we theoretically propose and experimentally demonstrate a unique self-shielding RP based on a coupled-resonator microwave waveguide, with a topological defect being inductively coupled to a diode. This RP utilizes a charge-conjugation-(C) symmetric resonant-defect mode that is robust against disorder and demonstrates high transmittance at low incident powers. When the incident power exceeds a critical value, a self-induced resonant trapping effect occurs, leading to a dramatic suppression of transmittance and a simultaneous increase of the reflectance close to unity. The proposed RP device is self-protected from overheating and electrical breakdown and can be utilized in radars, reflection altimeters, and a broad range of communication systems.

AB - Receiver protectors (RPs) shield sensitive electronics from high-power incoming signals that might damage them. Typical RP schemes range from simple fusing and PIN diodes to superconducting circuits and plasma cells-each having a variety of drawbacks ranging from unacceptable system downtime and self-destruction to significant insertion losses and power consumption. Here, we theoretically propose and experimentally demonstrate a unique self-shielding RP based on a coupled-resonator microwave waveguide, with a topological defect being inductively coupled to a diode. This RP utilizes a charge-conjugation-(C) symmetric resonant-defect mode that is robust against disorder and demonstrates high transmittance at low incident powers. When the incident power exceeds a critical value, a self-induced resonant trapping effect occurs, leading to a dramatic suppression of transmittance and a simultaneous increase of the reflectance close to unity. The proposed RP device is self-protected from overheating and electrical breakdown and can be utilized in radars, reflection altimeters, and a broad range of communication systems.

KW - Defects

KW - Electromagnetic induction

KW - Semiconductor diodes

KW - Topology

KW - Charge conjugation

KW - Electrical breakdown

KW - Inductively-coupled

KW - Microwave waveguides

KW - Receiver protector

KW - Sensitive electronics

KW - Superconducting circuit

KW - Topological defect

KW - Microwave resonators

U2 - 10.1103/PhysRevApplied.13.034067

DO - 10.1103/PhysRevApplied.13.034067

M3 - Journal article

VL - 13

JO - Physical Review Applied

JF - Physical Review Applied

SN - 2331-7019

IS - 3

M1 - 034067

ER -