Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
| Publication date | 2010 |
|---|---|
| Host publication | Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE |
| Place of Publication | New York |
| Publisher | IEEE |
| Pages | 1446-1449 |
| Number of pages | 4 |
| ISBN (print) | 978-1-4244-9106-3 |
| <mark>Original language</mark> | English |
| Event | IEEE Nuclear Science Symposium (NSS)/Medical Imaging Conference (MIC)/17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors - Knoxville Duration: 30/10/2010 → 6/11/2010 |
| Conference | IEEE Nuclear Science Symposium (NSS)/Medical Imaging Conference (MIC)/17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors |
|---|---|
| City | Knoxville |
| Period | 30/10/10 → 6/11/10 |
| Conference | IEEE Nuclear Science Symposium (NSS)/Medical Imaging Conference (MIC)/17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors |
|---|---|
| City | Knoxville |
| Period | 30/10/10 → 6/11/10 |
Deformations can build up in the production stages of the GEM-foils. They can affect the performance of the foils and reduce the lifetime of the detector. With an optical scanning system that we have obtained and developed to improve our quality control system for GEM-detector construction we can locate and study different types of defects on the GEM-foils. We studied standard 100 mm x 100 mm GEM-foils by assembling them as a single-GEM detector with XY-readout and irradiated the areas with defects with X-rays from Fe-55 source. In this paper we present the results of these measurements.