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Study of GEM-Foil Defects with Optical Scanning System

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Study of GEM-Foil Defects with Optical Scanning System. / Kalliokoski, M.; Hilden, T.; Garcia, F. et al.
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE. New York: IEEE, 2010. p. 1446-1449.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

Harvard

Kalliokoski, M, Hilden, T, Garcia, F, Lauhakangas, R & Numminen, A 2010, Study of GEM-Foil Defects with Optical Scanning System. in Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE. IEEE, New York, pp. 1446-1449, IEEE Nuclear Science Symposium (NSS)/Medical Imaging Conference (MIC)/17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, Knoxville, 30/10/10. https://doi.org/10.1109/NSSMIC.2010.5874011

APA

Kalliokoski, M., Hilden, T., Garcia, F., Lauhakangas, R., & Numminen, A. (2010). Study of GEM-Foil Defects with Optical Scanning System. In Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE (pp. 1446-1449). IEEE. https://doi.org/10.1109/NSSMIC.2010.5874011

Vancouver

Kalliokoski M, Hilden T, Garcia F, Lauhakangas R, Numminen A. Study of GEM-Foil Defects with Optical Scanning System. In Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE. New York: IEEE. 2010. p. 1446-1449 doi: 10.1109/NSSMIC.2010.5874011

Author

Kalliokoski, M. ; Hilden, T. ; Garcia, F. et al. / Study of GEM-Foil Defects with Optical Scanning System. Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE. New York : IEEE, 2010. pp. 1446-1449

Bibtex

@inproceedings{a5bbefacde854c498417c6cedc48327e,
title = "Study of GEM-Foil Defects with Optical Scanning System",
abstract = "Deformations can build up in the production stages of the GEM-foils. They can affect the performance of the foils and reduce the lifetime of the detector. With an optical scanning system that we have obtained and developed to improve our quality control system for GEM-detector construction we can locate and study different types of defects on the GEM-foils. We studied standard 100 mm x 100 mm GEM-foils by assembling them as a single-GEM detector with XY-readout and irradiated the areas with defects with X-rays from Fe-55 source. In this paper we present the results of these measurements.",
author = "M. Kalliokoski and T. Hilden and F. Garcia and R. Lauhakangas and A. Numminen",
year = "2010",
doi = "10.1109/NSSMIC.2010.5874011",
language = "English",
isbn = "978-1-4244-9106-3",
pages = "1446--1449",
booktitle = "Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE",
publisher = "IEEE",
note = "IEEE Nuclear Science Symposium (NSS)/Medical Imaging Conference (MIC)/17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors ; Conference date: 30-10-2010 Through 06-11-2010",

}

RIS

TY - GEN

T1 - Study of GEM-Foil Defects with Optical Scanning System

AU - Kalliokoski, M.

AU - Hilden, T.

AU - Garcia, F.

AU - Lauhakangas, R.

AU - Numminen, A.

PY - 2010

Y1 - 2010

N2 - Deformations can build up in the production stages of the GEM-foils. They can affect the performance of the foils and reduce the lifetime of the detector. With an optical scanning system that we have obtained and developed to improve our quality control system for GEM-detector construction we can locate and study different types of defects on the GEM-foils. We studied standard 100 mm x 100 mm GEM-foils by assembling them as a single-GEM detector with XY-readout and irradiated the areas with defects with X-rays from Fe-55 source. In this paper we present the results of these measurements.

AB - Deformations can build up in the production stages of the GEM-foils. They can affect the performance of the foils and reduce the lifetime of the detector. With an optical scanning system that we have obtained and developed to improve our quality control system for GEM-detector construction we can locate and study different types of defects on the GEM-foils. We studied standard 100 mm x 100 mm GEM-foils by assembling them as a single-GEM detector with XY-readout and irradiated the areas with defects with X-rays from Fe-55 source. In this paper we present the results of these measurements.

U2 - 10.1109/NSSMIC.2010.5874011

DO - 10.1109/NSSMIC.2010.5874011

M3 - Conference contribution/Paper

SN - 978-1-4244-9106-3

SP - 1446

EP - 1449

BT - Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE

PB - IEEE

CY - New York

T2 - IEEE Nuclear Science Symposium (NSS)/Medical Imaging Conference (MIC)/17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors

Y2 - 30 October 2010 through 6 November 2010

ER -