Rights statement: This is an author-created, un-copyedited version of an article published in Chinese Physics B. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at doi: 10.1088/1674-1056/ac657d
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Research output: Contribution to Journal/Magazine › Journal article › peer-review
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TY - JOUR
T1 - Synthesis of hexagonal boron nitride films by dual temperature zone low-pressure chemical vapor deposition
AU - Zhu, Zhifu
AU - Wang, Shaotang
AU - Zou, Jijun
AU - Huang, He
AU - Sun, Zhijia
AU - Xiu, Qinglei
AU - Zhang, Zhongming
AU - Yue, Xiuping
AU - Zhang, Yang
AU - Qu, Jinhui
AU - Gan, Yong
N1 - This is an author-created, un-copyedited version of an article published in Chinese Physics B. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at doi: 10.1088/1674-1056/ac657d
PY - 2022/8/31
Y1 - 2022/8/31
N2 - Hexagonal boron nitride (h-BN) films are synthesized by dual temperature zone low-pressure chemical vapor deposition (LPCVD) through using a single ammonia borane precursor on non-catalytic c-plane Al2O3 substrates. The grown films are confirmed to be h-BN films by various characterization methods. Meanwhile, the growth rates and crystal quality of h-BN films at different positions in the dual temperature zone are studied. It is found that the growth rates and crystal quality of the h-BN films at different positions on the substrate are significantly different. The growth rates of the h-BN thin films show their decreasing trends with the rearward position, while the crystal quality is improved. This work provides an experimental basis for the preparation of large area wafer thick h-BN films by LPCVD.
AB - Hexagonal boron nitride (h-BN) films are synthesized by dual temperature zone low-pressure chemical vapor deposition (LPCVD) through using a single ammonia borane precursor on non-catalytic c-plane Al2O3 substrates. The grown films are confirmed to be h-BN films by various characterization methods. Meanwhile, the growth rates and crystal quality of h-BN films at different positions in the dual temperature zone are studied. It is found that the growth rates and crystal quality of the h-BN films at different positions on the substrate are significantly different. The growth rates of the h-BN thin films show their decreasing trends with the rearward position, while the crystal quality is improved. This work provides an experimental basis for the preparation of large area wafer thick h-BN films by LPCVD.
U2 - 10.1088/1674-1056/ac657d
DO - 10.1088/1674-1056/ac657d
M3 - Journal article
VL - 31
JO - Chinese Physics B
JF - Chinese Physics B
SN - 1674-1056
IS - 8
M1 - 086103
ER -