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Professor Anthony Dorey

Emeritus

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  1. 1992
  2. Published

    An integrated electronic degree scheme - the Lancaster electronics course.

    Bradley, D. A., Dorey, A. P., Silvester, P. J. & Adelson, R. M., 1992, Innovative teaching in engineering. Smith, R. A. (ed.). London: Ellis Horwood, 530 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  3. Published

    Analogue behavioural modelling at systems level.

    Bratt, A., Harvey, R. J. A. & Dorey, A. P., 1992, IEE PG EC10/C11 colloquium on linear analogue circuits and systems. IEE, Vol. 158. p. 14/1-14/9

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  4. Published

    Integrating electronics with mechanical engineering.

    Dorey, A. P. & Bradley, D. A., 1992, 6th conference on teaching electronic engineering in degree courses. University of Hull, p. 28.1-28.8

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  5. Published

    Mathematics in electronic engineering

    Tunnicliffe-Wilson, J. C. & Dorey, A. P., 1992, 6th conference on teaching electronic engineering in degree courses. Hull, p. 43/1-43/9

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  6. Published

    Reliability indicators.

    Richardson, A. M. D. & Dorey, A. P., 1992, Third European symposium of reliability of electron devices, failure, physics and analysis (ESREF). Schabisch Gmund, p. 277-285 9 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  7. Published

    Supply current monitoring in cmos circuits for reliability prediction and test.

    Richardson, A. M. D. & Dorey, A. P., 1992, In: Quality and Reliability Engineering International. 8, 6, p. 543-548 6 p.

    Research output: Contribution to Journal/Magazine › Journal article

  8. 1993
  9. Published

    A review of testing methods for mixed signal ICs.

    Harvey, R. J. A., Bratt, A. H. & Dorey, A. P., 1993, In: Microelectronics Journal. 24, 6, p. 663-674 12 p.

    Research output: Contribution to Journal/Magazine › Journal article

  10. Published

    Aspects of current reference generation and distribution for IDDx pass/fail current determination.

    Bratt, A., Harvey, R. J. A., Dorey, A. P. & Richardson, A. M. D., 1993, Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240. London

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  11. Published

    Design-for-test structure to facilitate test vector application with low performance loss in non-test mode.

    Bratt, A., Harvey, R. J. A., Dorey, A. P. & Richardson, A. M. D., 1993, In: Electronics Letters. 29, 16, p. 1438-1440 3 p.

    Research output: Contribution to Journal/Magazine › Journal article

  12. 1994
  13. Published

    Application specific integrated circuit implementation of siso control laws.

    Burge, S. E., Grout, I. A. & Dorey, A. P., 1994, Proceedings of the IEE international conference on control '94. London: IEE, p. 1104-1110 7 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

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