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Professor Andrew Richardson

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  1. Published

    Test strategies for electrode degradation in bio-fluidic microsystems.

    Al-Gayem, Q., Honguan, L., Richardson, A. & Burd, N., 02/2011, In: Journal of Electronic Testing. 27, 1, p. 57-68 12 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  2. Published

    An on-line monitoring technique for electrode degradation in bio-fluidic microsystems.

    Al-Gayem, Q., Liu, H., Richardson, A. M. D., Burd, N. & Kumar, M., 10/2010, Proceedings of the 2010 IEEE International Test Conference (ITC). Austin, Texas: IEEE, p. 1-10 10 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  3. Published

    An oscillation-based technique for degradation monitoring of sensing and actuation electrodes within microfluidic systems.

    Al-Gayem, Q., Richardson, A., Liu, H. & Burd, N., 02/2011, In: Journal of Electronic Testing. 27, 3, p. 375-387 13 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  4. Published

    Built-in Test Solutions for the Electrode Structures in Bio-Fluidic Microsystems

    Al-Gayem, Q., Liu, H., Richardson, A. & Burd, N., 2009, ETS 2009: EUROPEAN TEST SYMPOSIUM, PROCEEDINGS. LOS ALAMITOS: IEEE COMPUTER SOC, p. 73-78 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  5. Published

    Scanning the strength of a test signal to monitor electrode degradation within bio-fluidic microsystems

    Al-Gayem, Q., Liu, H., Khan, H. & Richardson, A., 2013, On-Line Testing Symposium (IOLTS), 2013 IEEE 19th International. IEEE, p. 133-138 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  6. Published

    Mixed signal test - Techniques, applications and demands

    Baker, K., Richardson, A. M. & Dorey, A. P., 12/1996, In: IEE Proceedings - Circuits, Devices and Systems. 143, 6, p. 358-365 8 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  7. Published

    Current-mode techniques for self-testing analogue circuits

    Baturone, I., SanchezSolano, S., Richardson, A. M. & Huertas, J. L., 1997, IDDQ Testing, 1997. Digest of Papers., IEEE International Workshop on . Jayasumana, AP. & Tong, C. (eds.). LOS ALAMITOS: I E E E, COMPUTER SOC PRESS, p. 33-37 5 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  8. Published

    Supply Current Monitoring for Testing CMOS Analog Circuits

    Baturone, I., Huertas, J. L., Solano, S. S. & Richardson, A. M., 1996

    Research output: Other contribution

  9. Published

    Development of class 1 QTAG monitor.

    Bratt, A., Baker, K., Richardson, A. M. D. & Welbers, A., 1994, Proceedings of an international test conference: the next 25 years. IEEE Service Centre

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  10. Published

    A design-for-test structure for optimising analogue and mixed signal IC test

    Bratt, A., Richardson, A. M. D., Harvey, R. & Dorey, A. P., 03/1995, European Design and Test Conference. IEEE, p. 24-33 10 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  11. Published

    Aspects of current reference generation and distribution for IDDx pass/fail current determination.

    Bratt, A., Harvey, R. J. A., Dorey, A. P. & Richardson, A. M. D., 1993, Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240. London

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  12. Published

    Design-for-test structure to facilitate test vector application with low performance loss in non-test mode.

    Bratt, A., Harvey, R. J. A., Dorey, A. P. & Richardson, A. M. D., 1993, In: Electronics Letters. 29, 16, p. 1438-1440 3 p.

    Research output: Contribution to Journal/Magazine › Journal article

  13. Published

    Motivations and techniques of built in self-test for embedded frequency synthesis systems incorporating charge pump phase-locked loops.

    Burbidge, M., Lechner, A., Bell, G. & Richardson, A. M. D., 2004, IEE proceedings - circuits, devices and systems. 4 ed. Vol. 151. p. 337-348 12 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  14. Published

    Evaluation and detection of deterministic jitter causes in CP-PLLs due to macro level faults and pre-detection using simple methods.

    Burbidge, M. J., Lechner, A. & Richardson, A. M. D., 2003, In: Proceedings of the 9th IEEE international mixed signal test workshop (IMSTW03). p. 157-164 8 p.

    Research output: Contribution to Journal/Magazine › Journal article

  15. Published

    Investigations for minimum invasion digital only built in ‘ramp’ based test techniques for charge pump PLLs.

    Burbidge, M. J., Poullet, F., Tijou, J. & Richardson, A. M. D., 08/2003, In: Journal of Electronic Testing. 19, 4, p. 481-490 10 p.

    Research output: Contribution to Journal/Magazine › Journal article

  16. Published

    Investigations of automatic built in transient step response monitoring for embedded second order charge pump phase locked loop frequency synthesizers.

    Burbidge, M. J., Tijou, J. & Richardson, A. M. D., 2003, In: Journal of Electronic Testing.

    Research output: Contribution to Journal/Magazine › Journal article

  17. Published

    Techniques for automatic on chip closed loop transfer function monitoring for embedded charge pump phase locked loops.

    Burbidge, M. J., Tijou, J. & Richardson, A. M. D., 19/12/2003, Design, Automation and Test in Europe Conference and Exhibition, 2003. p. 496-501 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  18. Published

    Investigations for minimum invasion digital only built in ‘ramp’ based test techniques for charge pump PLLs.

    Burbidge, M. J., Tijou, J., Poullet, F. & Richardson, A. M. D., 2002, Proceedings of the Seventh IEEE European Test Workshop, 2002.. IEEE, p. 95-102 8 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  19. Published

    Simple digital only test approach for embedded charge-pump phase-locked loops.

    Burbidge, M. & Richardson, A. M. D., 2001, In: Electronics Letters. 37, 22, p. 1318-1319 2 p.

    Research output: Contribution to Journal/Magazine › Journal article

  20. Published

    Test techniques for embedded charge pump phase-locked loops: problems, current BIST techniques and alternative suggestions.

    Burbidge, M., Richardson, A. M. D. & Lechner, A., 2001, Proceedings of the 7th IEEE international test workshop. p. 97-102 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  21. Published

    Bit-stream manipulation for SD modulator failure mode analysis.

    Burbidge, M., Georgopoulos, K., Lechner, A. & Richardson, A., 2006, Proceedings of the 11th IEEE European test symposium..

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  22. Published

    Investigations into testability improvements on a 16 bit audio sigma-delta ADC through the use of on-chip techniques.

    De Venuto, D., Compagne, E. & Richardson, A. M. D., 2003, Proceedings of IMSTW 2003.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  23. Published

    Online Testing of MEMS Based on Encoded Stimulus Superposition.

    Dumas, N., Xu, Z., Georgopolis, K., Bunyan, J. & Richardson, A., 12/2008, In: Journal of Electronic Testing. 24, 6, p. 555-566 12 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  24. Published

    Towards a health monitor for system in package with MEMS functionality.

    Dumas, N. & Richardson, A., 06/2006. 6 p.

    Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review

  25. Published

    A novel method for test and calibration of capacitive accelerometers with a fully electrical setup

    Dumas, N., Azaies, F., Mailly, F., Richardson, A. & Nouet, P., 2008, Design and Diagnostics of Electronic Circuits and Systems, 2008. DDECS 2008. 11th IEEE Workshop on . Straube, B., Drutarovsky, M., Renovell, M., Gramata, P. & Fischerova, M. (eds.). LOS ALAMITOS: IEEE COMPUTER SOC, p. 304-309 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

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