Home > Research > Researchers > Professor Andrew Richardson > Publications

Research

Professor Andrew Richardson

Professor

1 - 25 out of 132Page size: 25
RSS feed of this list
Sort by: Type
  1. Chapter (peer-reviewed)
  2. Published

    Test of A/D Converters

    Richardson, A. & Lechner, A., 2008, Test & Diagnostics of Analogue, Mixed Signal & RF Integrated Circuits. Sun, Y. (ed.). Stevenage: IET Press, p. 213-234 22 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter (peer-reviewed)

  3. Published

    Phase Locked Loop Test Methodology

    Richardson, A. & Burbidge, M., 2008, Test and Diagnosis of Analogue, Mixed-signal and RF Integrated Circuits. Sun, Y. (ed.). Stevenage: IET Press, p. 277-306 30 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter (peer-reviewed)

  4. Chapter
  5. Published

    An on-line monitoring technique for electrode degradation in bio-fluidic microsystems.

    Al-Gayem, Q., Liu, H., Richardson, A. M. D., Burd, N. & Kumar, M., 10/2010, Proceedings of the 2010 IEEE International Test Conference (ITC). Austin, Texas: IEEE, p. 1-10 10 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  6. Published

    Acoustic system for online wiring test on aircraft.

    Xu, Z., Koltsov, D., Richardson, A. & Sutherland, A., 18/06/2008, IEEE 14th International Mixed-Signals, Sensors, and Systems Test Workshop, 2008. IMS3TW 2008.. IEEE, p. 1-4 4 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  7. Published

    Bit-stream manipulation for SD modulator failure mode analysis.

    Burbidge, M., Georgopoulos, K., Lechner, A. & Richardson, A., 2006, Proceedings of the 11th IEEE European test symposium..

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  8. Published

    Modelling the behaviour of soldier joints for wafer level SIP.

    Liu, H., Strusevich, N., Stoyanov, S., Bailey, C., Richardson, A. M. D., Dumas, N., Yannou, J. M. & Georgel, V., 2006, Proceedings of the 8th IEEE electronics packaging technology conference..

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  9. Published

    Behavioural error injection, spectral analysis and error detection for a 4th order single-loop sigma-delta converter using Walsh transforms.

    Georgopoulos, K., Burbidge, M., Lechner, A. & Richardson, A. M. D., 2005, Proceedings of the ETS workshop on Testing of High Resolution Mixed Signal Interfaces.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  10. Published

    Investigation into the Use of Alternative Transformation Techniques for High-Resolution A/D Converter Testing.

    Georgopoulos, K., Burbidge, M., Lechner, A. & Richardson, A. M. D., 2005, Proceedings of the IEEE Mixed Signal Test Workshop.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  11. Published

    Design Considerations for On-line Testing of a Capacitive Accelerometer.

    Jeffery, C., Bunyan, R. J. T., Combes, D., King, D. O. & Richardson, A. M. D., 2005, Proceedings of the 11th IEEE International Mixed-Signals Testing Workshop. p. 220-223 4 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  12. Published

    The integration of on-line monitoring and reconfiguration functions using IEEE1149.4 into a safety critical automotive electronic control unit.

    Jeffery, C., Cutajar, R., Richardson, A. M. D., Prosser, S., Lickess, M. & Riches, S., 2005, Proceedings of Design, Automation and Test in Europe, 2005.. Vol. 3. p. 153-158 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  13. Published

    Motivations and techniques of built in self-test for embedded frequency synthesis systems incorporating charge pump phase-locked loops.

    Burbidge, M., Lechner, A., Bell, G. & Richardson, A. M. D., 2004, IEE proceedings - circuits, devices and systems. 4 ed. Vol. 151. p. 337-348 12 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  14. Published

    Techniques for automatic on chip closed loop transfer function monitoring for embedded charge pump phase locked loops.

    Burbidge, M. J., Tijou, J. & Richardson, A. M. D., 19/12/2003, Design, Automation and Test in Europe Conference and Exhibition, 2003. p. 496-501 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  15. Published

    Construction of nonlinear dynamic MEMS component models using cosserat theory.

    Wang, C., Richardson, A. M. D., Liu, D., Rosing, R., Tucker, R. & De Masi, B., 05/2003, Proceedings of the SPIE design, test, integration and packaging of MEMS symposium. France: Cannes Mandelieu

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  16. Published

    Investigations into testability improvements on a 16 bit audio sigma-delta ADC through the use of on-chip techniques.

    De Venuto, D., Compagne, E. & Richardson, A. M. D., 2003, Proceedings of IMSTW 2003.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  17. Published

    Online monitoring for automotive sub-systems using 1149.4.

    Jeffrey, C., Lechner, A. & Richardson, A. M. D., 2003, EPRINTS-BOOK-TITLE. 1.3 ed.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  18. Published

    Re-using IEEE1149.4 as an infrastructure for online monitoring.

    Jeffrey, C., Lechner, A. & Richardson, A. M. D., 2003, Proceedings of the 9th IEEE international mixed signal test workshop (IMSTW03). p. 247-249 3 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  19. Published

    Modelling techniques for reliability prediction in MEMS technologies.

    Rosing, R. & Richardson, A. M. D., 2003, Proceedings of the Nanotech 2003 conference.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  20. Published

    Investigations for minimum invasion digital only built in ‘ramp’ based test techniques for charge pump PLLs.

    Burbidge, M. J., Tijou, J., Poullet, F. & Richardson, A. M. D., 2002, Proceedings of the Seventh IEEE European Test Workshop, 2002.. IEEE, p. 95-102 8 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  21. Published

    Test techniques for embedded charge pump phase-locked loops: problems, current BIST techniques and alternative suggestions.

    Burbidge, M., Richardson, A. M. D. & Lechner, A., 2001, Proceedings of the 7th IEEE international test workshop. p. 97-102 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  22. Published

    3DB challenge for DfT, DfM, DOT and BIST integration into analogue and mixed signal ICs.

    Lechner, A., Burbidge, M. J., Richardson, A. M. D. & Hermes, B., 2001, Proceedings of the 2nd Latin-American test workshop (LATW ’01). p. 194-199 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  23. Published

    A failure mode analysis of a 6-bit folding ADCs.

    Lechner, A., Richardson, A. M. D., Burbidge, M. & Hermes, B., 2001, Proceedings of the 7th IEEE international mixed-signal testing workshop (IMSTW ’01). p. 19-23 5 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  24. Published

    Short circuit faults in state-of-the-art ADCs – are they hard or soft?

    Lechner, A., Richardson, A. M. D. & Hermes, B., 2001, 10th Asian Test Symposium : proceedings : 19-21 November, 2001, Kyoto, Japan. IEEE Computer Society, p. 417-422 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  25. Published

    Towards a better understanding of failure modes and test requirements of ADCs.

    Lechner, A., Richardson, A. M. D. & Hermes, B., 2001, Proceedings of a conference: automation and test in Europe (DATE ’01). p. 803

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  26. Published

    Finite element analysis to support component level fault modelling for MEMS.

    Reichenbach, R., Rosing, R., Richardson, A. M. D. & Dorey, A. P., 2001, Proceedings of SPIE design, test, integration and packaging of MEMS symposium. Vol. 4408. p. 147-158 12 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  27. Published

    Generation of component level fault models for MEMS.

    Rosing, R., Reichenbach, R., Richardson, A. M. D. & Dorey, A. P., 2001, Proceedings of the 7th international mixed-signal testing workshop (IMSTW ’01). p. 40-45 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

Previous 1 2 3 4 5 6 Next

Back to top