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Professor Andrew Richardson

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  1. 1992
  2. Published

    Reliability indicators.

    Richardson, A. M. D. & Dorey, A. P., 1992, Third European symposium of reliability of electron devices, failure, physics and analysis (ESREF). Schabisch Gmund, p. 277-285 9 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  3. Published

    Supply current monitoring in cmos circuits for reliability prediction and test.

    Richardson, A. M. D. & Dorey, A. P., 1992, In: Quality and Reliability Engineering International. 8, 6, p. 543-548 6 p.

    Research output: Contribution to Journal/Magazine › Journal article

  4. 1993
  5. Published

    Aspects of current reference generation and distribution for IDDx pass/fail current determination.

    Bratt, A., Harvey, R. J. A., Dorey, A. P. & Richardson, A. M. D., 1993, Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240. London

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  6. Published

    Design-for-test structure to facilitate test vector application with low performance loss in non-test mode.

    Bratt, A., Harvey, R. J. A., Dorey, A. P. & Richardson, A. M. D., 1993, In: Electronics Letters. 29, 16, p. 1438-1440 3 p.

    Research output: Contribution to Journal/Magazine › Journal article

  7. Published

    Test evaluation for complex mixed signal ICs by introducing layout dependent faults.

    Harvey, R. J. A., Richardson, A. M. D., Bruls, E. M. J. & Baker, K., 1993, Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240. London, p. 6/1-8

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  8. 1994
  9. Published

    Analogue Fault Simulation Based on Layout-Dependent Fault Models.

    Harvey, R., Richardson, A. M. D., Baker, K. & Bruls, E., 1994, Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years. Washington, DC, USA: IEEE Computer Society, p. 641-649 9 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  10. Published

    BIST and diagnostics for microsystems.

    Olbrich, T., Bradley, D. A. & Richardson, A. M. D., 1994, Proceedings of the 7th ISATA conference: dedicated conferences on mechatronics and supercomputing applications in the transportation industries. Croydon: Automotive Automation, p. 575-580 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  11. Published

    BIST and diagnostics for safety critical microsystems.

    Olbrich, T., Richardson, A. M. D. & Bradley, D. A., 1994, Proceedings of an ESREF conference. Glasgow, p. 511-518 8 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  12. Published

    Development of class 1 QTAG monitor.

    Bratt, A., Baker, K., Richardson, A. M. D. & Welbers, A., 1994, Proceedings of an international test conference: the next 25 years. IEEE Service Centre

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  13. Published

    Self-test and diagnostics for smart sensors in automotive applications.

    Olbrich, T., Bradley, D. A. & Richardson, A. M. D., 1994, Proceedings of the IEE colloquium on automotive sensors. p. 3/1-4

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

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