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Professor Andrew Richardson

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  1. Journal article
  2. Published

    System in Package Technology - Design for Manufacture Challenges.

    Richardson, A. M. D., Bailey, C., Dumas, N. & Yannou, J. M., 1/02/2007, In: Circuit World. 33, 1, p. 36-46 11 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  3. Published

    Investigation into the use of hybrid solutions for high resolution A/D converter testing.

    Lechner, A., Georgopoulos, K., Burbidge, M. & Richardson, A., 12/2006, In: Journal of Electronic Testing. 22, 4-6, p. 359-370 12 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  4. Published

    Guest editorial.

    Richardson, A. M. D., Mir, S. & Cheng, T., 12/2006, In: Journal of Electronic Testing. 22, 4-6, p. 311

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  5. Published

    A capacitance and optical method for the static and dynamic characterization of micro electro mechanical systems (MEMS) devices.

    Richardson, A. M. D., Ferraris, E., Fassi, I., De Masi, B. & Rosing, R., 1/09/2006, In: Microsystem Technologies. 12, 10-11, p. 1053-1061 9 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  6. Published

    Bringing Multi-Domain Functions to Intelligent Systems through MEMS Technology Platforms – The INTEGRAMplus Access Service.

    Richardson, A., Pickering, C., McNie, M., Reeves, C., Schropfer, G., Knapp, H. & Bosshard, C., 2006, In: MST News (VDI/VDE Technologiezentrum Informationstechnic). 4, p. 38-40 3 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  7. Published

    INTEGRAMplus : a new European service project providing development platforms for integrated micro-nano technologies and products.

    Richardson, A. M. D., Pickering, C., McNie, M. & Reeves, C. L., 2006, In: MST News (VDI/VDE Technologiezentrum Informationstechnic).

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  8. Published

    MNT needs methodologies and software tools.

    Richardson, A. M. D., Solomon, P. & El-Fatatry, A., 2006, In: MST News (VDI/VDE Technologiezentrum Informationstechnic). 2, p. 16-35 20 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  9. Published

    The integration of on-line monitoring and reconfiguration functions into a safety critical automotive electronic control unit.

    Jeffery, C., Cutajar, R., Richardson, A. M. D., Prosser, S., Lickess, M. & Riches, S., 08/2005, In: Journal of Electronic Testing. 21, 4, p. 405-416 12 p.

    Research output: Contribution to Journal/Magazine › Journal article

  10. Published

    Using bias superposition to test a thick film conductance sensor.

    Jeffery, C., Zhou, X. & Richardson, A. M. D., 2005, In: Journal of Physics: Conference Series. 15, p. 161-166 6 p.

    Research output: Contribution to Journal/Magazine › Journal article

  11. Published

    Construction of Nonlinear Dynamic MEMS Component Models Using Cosserat Theory.

    Richardson, A., De Masi, B., Rosing, R. & Wang, C., 1/08/2004, In: Analog Integrated Circuits and Signal Processing. 40, 2, p. 117-130 14 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  12. Published

    Flexible embedded test solution for high-speed analogue front-end architectures.

    Lechner, A., Burbidge, M. J. & Richardson, A. M. D., 2004, In: IEE Proceedings - Circuits, Devices and Systems. 151, 4, p. 359-369 11 p.

    Research output: Contribution to Journal/Magazine › Journal article

  13. Published

    Investigations for minimum invasion digital only built in ‘ramp’ based test techniques for charge pump PLLs.

    Burbidge, M. J., Poullet, F., Tijou, J. & Richardson, A. M. D., 08/2003, In: Journal of Electronic Testing. 19, 4, p. 481-490 10 p.

    Research output: Contribution to Journal/Magazine › Journal article

  14. Published

    Evaluation and detection of deterministic jitter causes in CP-PLLs due to macro level faults and pre-detection using simple methods.

    Burbidge, M. J., Lechner, A. & Richardson, A. M. D., 2003, In: Proceedings of the 9th IEEE international mixed signal test workshop (IMSTW03). p. 157-164 8 p.

    Research output: Contribution to Journal/Magazine › Journal article

  15. Published

    Investigations of automatic built in transient step response monitoring for embedded second order charge pump phase locked loop frequency synthesizers.

    Burbidge, M. J., Tijou, J. & Richardson, A. M. D., 2003, In: Journal of Electronic Testing.

    Research output: Contribution to Journal/Magazine › Journal article

  16. Published

    Generation of component level fault models for MEMS

    Rosing, R., Reichenbach, R. & Richardson, A., 2002, In: Microelectronics Journal. 33, 10, p. 861-868 8 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  17. Published

    Simple digital only test approach for embedded charge-pump phase-locked loops.

    Burbidge, M. & Richardson, A. M. D., 2001, In: Electronics Letters. 37, 22, p. 1318-1319 2 p.

    Research output: Contribution to Journal/Magazine › Journal article

  18. Published

    Fault simulation and modelling of microelectromechanical systems.

    Rosing, R., Lechner, A., Richardson, A. M. D. & Dorey, A. P., 2000, In: IEE Journal on Computing and Control Engineering. 11, 5, p. 242-250 9 p.

    Research output: Contribution to Journal/Magazine › Journal article

  19. Published

    Integrating testability into microsystems

    Olbrich, T., Richardson, A., Vermeiren, W. & Straube, B., 02/1997, In: Microsystem Technologies. 3, 2, p. 72-79 8 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  20. Published

    Design-for-test (DfT) study on a current mode DAC

    Olbrich, T., Mozuelos, R., Richardson, A. & Bracho, S., 12/1996, In: IEE Proceedings - Circuits, Devices and Systems. 143, 6, p. 374-379 6 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  21. Published

    Mixed signal test - Techniques, applications and demands

    Baker, K., Richardson, A. M. & Dorey, A. P., 12/1996, In: IEE Proceedings - Circuits, Devices and Systems. 143, 6, p. 358-365 8 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  22. Published

    Built-in self-test and diagnostic support for safety critical microsystems

    Olbrich, T., Richardson, A. M. D. & Bradley, D. A., 07/1996, In: Microelectronics Reliability. 36, 7-8, p. 1125-1136 12 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  23. Published

    Built-In Self-Test in Intelligent Microsystems as a Contributor to System Quality and Performance

    Olbrich, T., Bradley, D. A. & Richardson, A. M. D., 1/06/1996, In: Quality Engineering. 8, 4, p. 601-613 13 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  24. Published

    Design and self-test for switched-current building blocks

    Olbrich, T. & Richardson, A., 1996, In: IEEE Design and Test of Computers. 13, 2, p. 10-17 8 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  25. Published

    PRACTICAL DFT STRATEGY FOR FAULT-DIAGNOSIS IN ACTIVE ANALOG FILTERS

    VAZQUEZ, D., RUEDA, A., HUERTAS, J. L. & RICHARDSON, A. M. D., 20/07/1995, In: Electronics Letters. 31, 15, p. 1221-1222 2 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  26. Published

    AC analysis of time discrete systems

    Olbrich, T., Harvey, R. J. A. & Richardson, A. M. D., 1995, In: IEE Seminar Digests. 1995, 192, p. 1 1 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  27. Published

    Design-for-test structure to facilitate test vector application with low performance loss in non-test mode.

    Bratt, A., Harvey, R. J. A., Dorey, A. P. & Richardson, A. M. D., 1993, In: Electronics Letters. 29, 16, p. 1438-1440 3 p.

    Research output: Contribution to Journal/Magazine › Journal article

  28. Published

    Supply current monitoring in cmos circuits for reliability prediction and test.

    Richardson, A. M. D. & Dorey, A. P., 1992, In: Quality and Reliability Engineering International. 8, 6, p. 543-548 6 p.

    Research output: Contribution to Journal/Magazine › Journal article

  29. Editorial
  30. Published

    Special Issue: Mixed-Technology Testing

    Lubaszewski, M. (ed.), Richardson, A. (ed.) & Su, C. C. (ed.), 07/2009, In: Microelectronics Journal. 40, 7, p. 1041-1041 1 p.

    Research output: Contribution to Journal/Magazine › Editorial › peer-review

  31. Published

    Guest Editorial

    Lubaszewski, M. (ed.), Richardson, A. (ed.) & Su, C. C. (ed.), 12/2007, In: Journal of Electronic Testing. 23, 6, p. 469-469 1 p.

    Research output: Contribution to Journal/Magazine › Editorial › peer-review

  32. Published

    Editorial: Mixed signal & analogue IC test technology

    Richardson, A. & Dorey, T., 12/1996, In: IEE Proceedings - Circuits, Devices and Systems. 143, 6, p. 357-357 1 p.

    Research output: Contribution to Journal/Magazine › Editorial › peer-review

  33. Working paper
  34. Published

    Initial background search on piezoelectric weight measurement used in urimeter application.

    Koltsov, D. & Richardson, A., 2006.

    Research output: Working paper

  35. Commissioned report
  36. Published

    Microsystems for structural health monitoring.

    Richardson, A., Van Heeren, H. & Neylon, S., 10/2008, European Commission.

    Research output: Book/Report/Proceedings › Commissioned report

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