Andrew Richardson - Publications & Outputs - Research Portal

Professor Andrew Richardson

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Published
3DB challenge for DfT, DfM, DOT and BIST integration into analogue and mixed signal ICs.
Lechner, A., Burbidge, M. J., Richardson, A. M. D. & Hermes, B., 2001, Proceedings of the 2nd Latin-American test workshop (LATW ’01). p. 194-199 6 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
A built-in test solution for a SMART silicon micromachined resonant pressure sensor.
Jeffery, C., Rosing, R. & Richardson, A. M. D., 2000, IEEE European Test Workshop. IEEE
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
A capacitance and optical method for the static and dynamic characterization of micro electro mechanical systems (MEMS) devices.
Richardson, A. M. D., Ferraris, E., Fassi, I., De Masi, B. & Rosing, R., 1/09/2006, In: Microsystem Technologies. 12, 10-11, p. 1053-1061 9 p.
Research output: Contribution to Journal/Magazine › Journal article › peer-review
Published
A Dependable Microelectronic Peptide Synthesizer Using Electrode Data
Richardson, A., Kerkhoff, H. G., Zhang, X., Mailly, F., Nouet, P. & Liu, H., 2008, In: VLSI Design. 2008, n/a, 9 p., 437879.
Research output: Contribution to Journal/Magazine › Journal article › peer-review
Published
A design for testability study on a high performance automatic gain control circuit.
Lechner, A., Richardson, A. M. D., Hermes, B. & Ohletz, M., 1998, Proceedings of the 16th IEEE VLSI test symposium. IEEE, p. 376-385 10 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
A design-for-test structure for optimising analogue and mixed signal IC test
Bratt, A., Richardson, A. M. D., Harvey, R. & Dorey, A. P., 03/1995, European Design and Test Conference. IEEE, p. 24-33 10 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
A digital partial built-in self-test structure for a high performance automatic gain control circuit
Lechner, A., Ferguson, J., Richardson, A. & Hermes, B., 1999, DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION 1999, PROCEEDINGS. Borrione, D. & Ernst, R. (eds.). LOS ALAMITOS: IEEE COMPUTER SOC, p. 232-238 7 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
A failure mode analysis of a 6-bit folding ADCs.
Lechner, A., Richardson, A. M. D., Burbidge, M. & Hermes, B., 2001, Proceedings of the 7th IEEE international mixed-signal testing workshop (IMSTW ’01). p. 19-23 5 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
A fault simulation methodology for MEMS.
Rosing, R., Richardson, A. M. D. & Dorey, A. P., 2000, Proceedings of the design automation and test in Europe conference. Paris: IEEE, p. 476-483 8 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
A fault simulation methodology for MEMS.
Rosing, R., Richardson, A. M. D. & Dorey, A. P., 2000, Proceedings of the IEE symposium on quality and automation (RESQUA 2000). Penang, Malaysia
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
A fault-tolerant MEF peptide synthesizer using control and direct sensing electrodes employing current and impedance tests
Zhang, X., Kerkhoff, H. G., Mailly, F., Nouet, P., Liu, H. & Richardson, A., 1/06/2007, 13th International mixed signals testing workshop and 3rd international GHz/Gbps test workshop, Póvoa de Varzim, Portugal. Portugal: University of Porto, p. 176-181 6 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
A housekeeping prognostic health management framework for microfluidic systems
Khan, H., Al-Gayem, Q. & Richardson, A. M. D., 1/06/2017, In: IEEE Transactions on Device and Materials Reliability. 17, 2, p. 438-449 12 p.
Research output: Contribution to Journal/Magazine › Journal article › peer-review
Published
A multi-mode MEMS sensor design to support system test and health & usage monitoring applications
Xu, Z., Richardson, A., Koltsov, D., Li, L., Begbie, M. & Wang, C., 1/05/2010, Test Symposium (ETS), 2010 15th IEEE European. p. 263 1 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
A new methodology for IC product quality estimation.
Olbrich, T., Grout, I., Eben Aimine, Y., Richardson, A. & Contensou, J., 1997, Proceedings of the European design and test conference (ED&TC '97). Paris: IEEE Computer Society Press
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
A new quality estimation methodology for mixed-signal and analogue ICs
Olbrich, T., Grout, I. A., Aimine, Y. E., Richardson, A. M. & Contensou, J., 1997, European Design and Test Conference, 1997. ED&TC 97. Proceedings . LOS ALAMITOS: I E E E, COMPUTER SOC PRESS, p. 573-580 8 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
A novel approach for online sensor testing based on an encoded test stimulus
Dumas, N., Xu, Z., Georgopoulos, K., Bunyan, R. J. T. & Richardson, A., 2007, ETS 2007: 12th IEEE European Test Symposium, Proceedings. LOS ALAMITOS: IEEE COMPUTER SOC, p. 105-110 6 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
A novel method for test and calibration of capacitive accelerometers with a fully electrical setup
Dumas, N., Azaies, F., Mailly, F., Richardson, A. & Nouet, P., 2008, Design and Diagnostics of Electronic Circuits and Systems, 2008. DDECS 2008. 11th IEEE Workshop on . Straube, B., Drutarovsky, M., Renovell, M., Gramata, P. & Fischerova, M. (eds.). LOS ALAMITOS: IEEE COMPUTER SOC, p. 304-309 6 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
AC analysis of time discrete systems
Olbrich, T., Harvey, R. J. A. & Richardson, A. M. D., 1995, In: IEE Seminar Digests. 1995, 192, p. 1 1 p.
Research output: Contribution to Journal/Magazine › Journal article › peer-review
Published
Acoustic system for online wiring test on aircraft.
Xu, Z., Koltsov, D., Richardson, A. & Sutherland, A., 18/06/2008, IEEE 14th International Mixed-Signals, Sensors, and Systems Test Workshop, 2008. IMS3TW 2008.. IEEE, p. 1-4 4 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
An approach to realistic fault prediction and layout design for testability in analog circuits
Prieto, J. A., Rueda, A., Grout, I., Peralias, E., Huertas, J. L. & Richardson, A. M. D., 1998, Design, Automation and Test in Europe, 1998 Proceedings. LOS ALAMITOS: IEEE COMPUTER SOC, p. 905-909 5 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
An approach to realistic fault prediction and layout design for testability in analogue circuits.
Prieto, J., Richardson, A. M. D., Rueda, A. & Grout, I., 1998, Proceedings of the conference on design, automation and test in Europe. Paris, p. 906-912 7 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
An Embedded Test & Health Monitoring Strategy for Detecting and Locating Faults in Aerospace Bus Systems.
Hannu, J., Koltsov, D., Xu, Z., Richardson, A. & Moilanen, M., 2008, In: Proceedings of the IEEE .
Research output: Contribution to Journal/Magazine › Journal article › peer-review
Published
An Integrated Diagnostic Reconfiguration (IDR) design approach for fault tolerant mixed signal integrated systems
Richardson, A., Sharif, E. & Dorey, A., 11/06/1998, p. 88-90. 3 p.
Research output: Contribution to conference - Without ISBN/ISSN › Conference paper
Published
An integrated diagnostic reconfiguration (IDR) technique for fault tolerant mixed signal microsystems.
Sharif, E., Dorey, A. P. & Richardson, A. M. D., 1998, Proceedings of the IEEE international circuits and systems symposium. IEEE
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
An on-line monitoring technique for electrode degradation in bio-fluidic microsystems.
Al-Gayem, Q., Liu, H., Richardson, A. M. D., Burd, N. & Kumar, M., 10/2010, Proceedings of the 2010 IEEE International Test Conference (ITC). Austin, Texas: IEEE, p. 1-10 10 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
An oscillation-based technique for degradation monitoring of sensing and actuation electrodes within microfluidic systems.
Al-Gayem, Q., Richardson, A., Liu, H. & Burd, N., 02/2011, In: Journal of Electronic Testing. 27, 3, p. 375-387 13 p.
Research output: Contribution to Journal/Magazine › Journal article › peer-review
Published
Analogue Fault Simulation Based on Layout-Dependent Fault Models.
Harvey, R., Richardson, A. M. D., Baker, K. & Bruls, E., 1994, Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years. Washington, DC, USA: IEEE Computer Society, p. 641-649 9 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
Applications of mixed signal test strategies to next generation microsystems.
Jeffery, C., Rosing, R. & Richardson, A. M. D., 2000, Design, modeling, and simulation in microelectronics. 4228 ed. SPIE (Society of Photo-Optical Instrumentation Engineers), p. 21-32 12 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
Aspects of current reference generation and distribution for IDDx pass/fail current determination.
Bratt, A., Harvey, R. J. A., Dorey, A. P. & Richardson, A. M. D., 1993, Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240. London
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
Behavioural error injection, spectral analysis and error detection for a 4th order single-loop sigma-delta converter using Walsh transforms.
Georgopoulos, K., Burbidge, M., Lechner, A. & Richardson, A. M. D., 2005, Proceedings of the ETS workshop on Testing of High Resolution Mixed Signal Interfaces.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
Bias superposition: an on-line test strategy for a MEMS based conductivity sensor
Jeffrey, C., Xu, Z. & Richardson, A., 2005, ETS 2005:10th IEEE European Test Symposium, Proceedings. LOS ALAMITOS: IEEE COMPUTER SOC, p. 88-93 6 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
BIST and diagnostics for microsystems.
Olbrich, T., Bradley, D. A. & Richardson, A. M. D., 1994, Proceedings of the 7th ISATA conference: dedicated conferences on mechatronics and supercomputing applications in the transportation industries. Croydon: Automotive Automation, p. 575-580 6 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
BIST and diagnostics for safety critical microsystems.
Olbrich, T., Richardson, A. M. D. & Bradley, D. A., 1994, Proceedings of an ESREF conference. Glasgow, p. 511-518 8 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
Bit-stream manipulation for SD modulator failure mode analysis.
Burbidge, M., Georgopoulos, K., Lechner, A. & Richardson, A., 2006, Proceedings of the 11th IEEE European test symposium..
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
Bringing Multi-Domain Functions to Intelligent Systems through MEMS Technology Platforms – The INTEGRAMplus Access Service.
Richardson, A., Pickering, C., McNie, M., Reeves, C., Schropfer, G., Knapp, H. & Bosshard, C., 2006, In: MST News (VDI/VDE Technologiezentrum Informationstechnic). 4, p. 38-40 3 p.
Research output: Contribution to Journal/Magazine › Journal article › peer-review
Published
Built-in self-test and diagnostic support for safety critical microsystems
Olbrich, T., Richardson, A. M. D. & Bradley, D. A., 07/1996, In: Microelectronics Reliability. 36, 7-8, p. 1125-1136 12 p.
Research output: Contribution to Journal/Magazine › Journal article › peer-review
Published
Built-In Self-Test in Intelligent Microsystems as a Contributor to System Quality and Performance
Olbrich, T., Bradley, D. A. & Richardson, A. M. D., 1/06/1996, In: Quality Engineering. 8, 4, p. 601-613 13 p.
Research output: Contribution to Journal/Magazine › Journal article › peer-review
Published
Built-in test of electrode degradation of multi-electrode array biosensors
Liu, H., Dumas, N., Richardson, A., Heal, R. & Kerkhoff, H. G., 1/06/2006, Proceedings of the 12th IEEE International mixed signal testing workshop (IMSTW'06), Edinburgh, United Kingdom. Lancaster, UK: ISLI en Lancaster University, p. 136-141 6 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
Built-in Test Solutions for the Electrode Structures in Bio-Fluidic Microsystems
Al-Gayem, Q., Liu, H., Richardson, A. & Burd, N., 2009, ETS 2009: EUROPEAN TEST SYMPOSIUM, PROCEEDINGS. LOS ALAMITOS: IEEE COMPUTER SOC, p. 73-78 6 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
Clock switching: a new design for current test (DcT) method for dynamic logic circuits
Rosing, R., Richardson, A. M. D., Kerkhoff, A. & Acosta, A., 1998, IDDQ Testing, 1998. Proceedings. 1998 IEEE International Workshop on. IEEE, p. 20-25 6 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
Construction of nonlinear dynamic MEMS component models using cosserat theory.
Wang, C., Richardson, A. M. D., Liu, D., Rosing, R., Tucker, R. & De Masi, B., 05/2003, Proceedings of the SPIE design, test, integration and packaging of MEMS symposium. France: Cannes Mandelieu
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
Construction of Nonlinear Dynamic MEMS Component Models Using Cosserat Theory.
Richardson, A., De Masi, B., Rosing, R. & Wang, C., 1/08/2004, In: Analog Integrated Circuits and Signal Processing. 40, 2, p. 117-130 14 p.
Research output: Contribution to Journal/Magazine › Journal article › peer-review
Published
Current-mode techniques for self-testing analogue circuits
Baturone, I., SanchezSolano, S., Richardson, A. M. & Huertas, J. L., 1997, IDDQ Testing, 1997. Digest of Papers., IEEE International Workshop on . Jayasumana, AP. & Tong, C. (eds.). LOS ALAMITOS: I E E E, COMPUTER SOC PRESS, p. 33-37 5 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
Defect oriented test development based on inductive fault analysis
Richardson, A., Kerkhoff, H. G. & Harvey, R., 22/06/1995, p. 2-11. 10 p.
Research output: Contribution to conference - Without ISBN/ISSN › Conference paper
Published
Defect-oriented vs. chematic-level based fault simulation for mixed-signal ICs.
Olbrich, T., Perez, J., Grout, I., Richardson, A. & Ferrer, C., 1996, Proceedings of the international test conference 1996. Washington DC, p. 511-520 10 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
Delivering Bio-Mems & Microfluidic Education Around Accessible Technologies
Richardson, A., Liu, H., Koltsov, D., Rosing, R., Ryan, T. & Wooton, R., 28/05/2008, Proceedings of the 8th European Workshop on Microelectronics Education. EDA Publishing, 2 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
Design and self-test for switched-current building blocks
Olbrich, T. & Richardson, A., 1996, In: IEEE Design and Test of Computers. 13, 2, p. 10-17 8 p.
Research output: Contribution to Journal/Magazine › Journal article › peer-review
Published
Design and simulation of a multi-function MEMS sensor for health and usage monitoring.
Xu, Z., Kotsov, D., Richardson, A., Li, L. & Begbie, M., 12/01/2010, In: Proceedings of IEEE Prognostics & System Health Management Conference. p. 1-7 7 p.
Research output: Contribution to Journal/Magazine › Journal article › peer-review
Published
Design and Test of an Oscillation-based System Architecture for DNA Sensor Arrays
Liu, H., Kerkhoff, H. G., Richardson, A., Zhang, X., Nouet, P. & Azais, F., 1/06/2005, Proceedings of 11th International Mixed Signal Test Workshop, Cannes, France. France: TIMA Laboratory, p. 1-6 6 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
Design Considerations for On-line Testing of a Capacitive Accelerometer.
Jeffery, C., Bunyan, R. J. T., Combes, D., King, D. O. & Richardson, A. M. D., 2005, Proceedings of the 11th IEEE International Mixed-Signals Testing Workshop. p. 220-223 4 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

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