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Professor Andrew Richardson

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  1. Chapter
  2. Published

    Modelling techniques for reliability prediction in MEMS technologies.

    Rosing, R. & Richardson, A. M. D., 2003, Proceedings of the Nanotech 2003 conference.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  3. Published

    Investigations for minimum invasion digital only built in ‘ramp’ based test techniques for charge pump PLLs.

    Burbidge, M. J., Tijou, J., Poullet, F. & Richardson, A. M. D., 2002, Proceedings of the Seventh IEEE European Test Workshop, 2002.. IEEE, p. 95-102 8 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  4. Published

    Test techniques for embedded charge pump phase-locked loops: problems, current BIST techniques and alternative suggestions.

    Burbidge, M., Richardson, A. M. D. & Lechner, A., 2001, Proceedings of the 7th IEEE international test workshop. p. 97-102 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  5. Published

    3DB challenge for DfT, DfM, DOT and BIST integration into analogue and mixed signal ICs.

    Lechner, A., Burbidge, M. J., Richardson, A. M. D. & Hermes, B., 2001, Proceedings of the 2nd Latin-American test workshop (LATW ’01). p. 194-199 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  6. Published

    A failure mode analysis of a 6-bit folding ADCs.

    Lechner, A., Richardson, A. M. D., Burbidge, M. & Hermes, B., 2001, Proceedings of the 7th IEEE international mixed-signal testing workshop (IMSTW ’01). p. 19-23 5 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  7. Published

    Short circuit faults in state-of-the-art ADCs – are they hard or soft?

    Lechner, A., Richardson, A. M. D. & Hermes, B., 2001, 10th Asian Test Symposium : proceedings : 19-21 November, 2001, Kyoto, Japan. IEEE Computer Society, p. 417-422 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  8. Published

    Towards a better understanding of failure modes and test requirements of ADCs.

    Lechner, A., Richardson, A. M. D. & Hermes, B., 2001, Proceedings of a conference: automation and test in Europe (DATE ’01). p. 803

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  9. Published

    Finite element analysis to support component level fault modelling for MEMS.

    Reichenbach, R., Rosing, R., Richardson, A. M. D. & Dorey, A. P., 2001, Proceedings of SPIE design, test, integration and packaging of MEMS symposium. Vol. 4408. p. 147-158 12 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  10. Published

    Generation of component level fault models for MEMS.

    Rosing, R., Reichenbach, R., Richardson, A. M. D. & Dorey, A. P., 2001, Proceedings of the 7th international mixed-signal testing workshop (IMSTW ’01). p. 40-45 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  11. Published

    Applications of mixed signal test strategies to next generation microsystems.

    Jeffery, C., Rosing, R. & Richardson, A. M. D., 2000, Design, modeling, and simulation in microelectronics. 4228 ed. SPIE (Society of Photo-Optical Instrumentation Engineers), p. 21-32 12 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  12. Published

    A built-in test solution for a SMART silicon micromachined resonant pressure sensor.

    Jeffery, C., Rosing, R. & Richardson, A. M. D., 2000, IEEE European Test Workshop. IEEE

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  13. Published

    Design-for-testability for mixed signal and analogue design.

    Richardson, A. M. D. & Lechner, A., 2000, Proceedings of 7th international conference on mixed design of integrated circuits and systems. Poland

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  14. Published

    A fault simulation methodology for MEMS.

    Rosing, R., Richardson, A. M. D. & Dorey, A. P., 2000, Proceedings of the design automation and test in Europe conference. Paris: IEEE, p. 476-483 8 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  15. Published

    A fault simulation methodology for MEMS.

    Rosing, R., Richardson, A. M. D. & Dorey, A. P., 2000, Proceedings of the IEE symposium on quality and automation (RESQUA 2000). Penang, Malaysia

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  16. Published

    A design for testability study on a high performance automatic gain control circuit.

    Lechner, A., Richardson, A. M. D., Hermes, B. & Ohletz, M., 1998, Proceedings of the 16th IEEE VLSI test symposium. IEEE, p. 376-385 10 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  17. Published

    Design for testability strategies for a high performance gain control circuit.

    Lechner, A., Richardson, A. M. D., Hermes, B. & Perkins, A., 1998, Proceedings of the international IEEE mixed signal test workshop. The Hague

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  18. Published

    An approach to realistic fault prediction and layout design for testability in analogue circuits.

    Prieto, J., Richardson, A. M. D., Rueda, A. & Grout, I., 1998, Proceedings of the conference on design, automation and test in Europe. Paris, p. 906-912 7 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  19. Published

    Design for testability strategies for mixed signal and analogue designs: from layout to system.

    Richardson, A. M. D., Lechner, A. & Olbrich, T., 1998, Proceedings of the 5th IEEE international conference on electronics, circuits and systems. Lisbon, p. 425-433 9 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  20. Published

    An integrated diagnostic reconfiguration (IDR) technique for fault tolerant mixed signal microsystems.

    Sharif, E., Dorey, A. P. & Richardson, A. M. D., 1998, Proceedings of the IEEE international circuits and systems symposium. IEEE

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  21. Published

    A new methodology for IC product quality estimation.

    Olbrich, T., Grout, I., Eben Aimine, Y., Richardson, A. & Contensou, J., 1997, Proceedings of the European design and test conference (ED&TC '97). Paris: IEEE Computer Society Press

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  22. Published

    Defect-oriented vs. chematic-level based fault simulation for mixed-signal ICs.

    Olbrich, T., Perez, J., Grout, I., Richardson, A. & Ferrer, C., 1996, Proceedings of the international test conference 1996. Washington DC, p. 511-520 10 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  23. Published

    A design-for-test structure for optimising analogue and mixed signal IC test

    Bratt, A., Richardson, A. M. D., Harvey, R. & Dorey, A. P., 03/1995, European Design and Test Conference. IEEE, p. 24-33 10 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  24. Published

    Development of class 1 QTAG monitor.

    Bratt, A., Baker, K., Richardson, A. M. D. & Welbers, A., 1994, Proceedings of an international test conference: the next 25 years. IEEE Service Centre

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  25. Published

    Analogue Fault Simulation Based on Layout-Dependent Fault Models.

    Harvey, R., Richardson, A. M. D., Baker, K. & Bruls, E., 1994, Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years. Washington, DC, USA: IEEE Computer Society, p. 641-649 9 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  26. Published

    BIST and diagnostics for microsystems.

    Olbrich, T., Bradley, D. A. & Richardson, A. M. D., 1994, Proceedings of the 7th ISATA conference: dedicated conferences on mechatronics and supercomputing applications in the transportation industries. Croydon: Automotive Automation, p. 575-580 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  27. Published

    Self-test and diagnostics for smart sensors in automotive applications.

    Olbrich, T., Bradley, D. A. & Richardson, A. M. D., 1994, Proceedings of the IEE colloquium on automotive sensors. p. 3/1-4

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  28. Published

    BIST and diagnostics for safety critical microsystems.

    Olbrich, T., Richardson, A. M. D. & Bradley, D. A., 1994, Proceedings of an ESREF conference. Glasgow, p. 511-518 8 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  29. Published

    Aspects of current reference generation and distribution for IDDx pass/fail current determination.

    Bratt, A., Harvey, R. J. A., Dorey, A. P. & Richardson, A. M. D., 1993, Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240. London

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  30. Published

    Test evaluation for complex mixed signal ICs by introducing layout dependent faults.

    Harvey, R. J. A., Richardson, A. M. D., Bruls, E. M. J. & Baker, K., 1993, Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240. London, p. 6/1-8

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  31. Published

    Reliability indicators.

    Richardson, A. M. D. & Dorey, A. P., 1992, Third European symposium of reliability of electron devices, failure, physics and analysis (ESREF). Schabisch Gmund, p. 277-285 9 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  32. Chapter (peer-reviewed)
  33. Published

    Test of A/D Converters

    Richardson, A. & Lechner, A., 2008, Test & Diagnostics of Analogue, Mixed Signal & RF Integrated Circuits. Sun, Y. (ed.). Stevenage: IET Press, p. 213-234 22 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter (peer-reviewed)

  34. Published

    Phase Locked Loop Test Methodology

    Richardson, A. & Burbidge, M., 2008, Test and Diagnosis of Analogue, Mixed-signal and RF Integrated Circuits. Sun, Y. (ed.). Stevenage: IET Press, p. 277-306 30 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter (peer-reviewed)

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