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Professor Andrew Richardson

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  1. Published

    Reconfigurable circuits for fault tolerant systems: factors to consider

    Richardson, A., Jeffrey, C. & Lechner, A., 21/06/2002, p. 215-218. 4 p.

    Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review

  2. Published

    Reconfigurable smart sensors for dependable systems

    Sharif, E., Richardson, A. & Dorey, T., 1/11/1997, Hardware Systems for Dependable Applications (Digest No: 1997/335), IEE Half-Day Colloquium on. IEEE, p. 2/1 -2/6 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  3. Published

    Reconfiguration based built-in self-test for analogue front-end circuits

    Richardson, A., Lechner, A. & Hermes, B., 18/06/1999, p. 243-247. 5 p.

    Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review

  4. Published

    Reliability indicators.

    Richardson, A. M. D. & Dorey, A. P., 1992, Third European symposium of reliability of electron devices, failure, physics and analysis (ESREF). Schabisch Gmund, p. 277-285 9 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  5. Published

    Re-using IEEE1149.4 as an infrastructure for online monitoring.

    Jeffrey, C., Lechner, A. & Richardson, A. M. D., 2003, Proceedings of the 9th IEEE international mixed signal test workshop (IMSTW03). p. 247-249 3 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  6. Published

    Scanning the strength of a test signal to monitor electrode degradation within bio-fluidic microsystems

    Al-Gayem, Q., Liu, H., Khan, H. & Richardson, A., 2013, On-Line Testing Symposium (IOLTS), 2013 IEEE 19th International. IEEE, p. 133-138 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  7. Published

    Self-Monitoring, Self-Healing Biomorphic Sensor Technology

    Richardson, A. & Cheneler, D., 3/10/2019, 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019. Gizopoulos, D., Alexandrescu, D., Papavramidou, P. & Maniatakos, M. (eds.). IEEE, p. 121-124 4 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  8. Published

    Self-test and diagnostics for smart sensors in automotive applications.

    Olbrich, T., Bradley, D. A. & Richardson, A. M. D., 1994, Proceedings of the IEE colloquium on automotive sensors. p. 3/1-4

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  9. Published

    Self-testing of micro-electrode array implemented as a bio-sensor

    Liu, H., Dumas, N. & Richardson, A., 1/06/2007, 13th International mixed signals testing workshop and 3rd international GHz/Gbps test workshop. Póvoa de Varzim, Portugal: IEEE Portugal section, p. 166-170 5 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  10. Published

    Sensor Testing Through Bias Superposition.

    Richardson, A. M. D., Bunyan, R., Mathias, H. & Nouet, P., 1/05/2007, In: Sensors and Actuators A: Physical. 136, 1, p. 441-455 15 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  11. Published

    Short circuit faults in state-of-the-art ADCs – are they hard or soft?

    Lechner, A., Richardson, A. M. D. & Hermes, B., 2001, 10th Asian Test Symposium : proceedings : 19-21 November, 2001, Kyoto, Japan. IEEE Computer Society, p. 417-422 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  12. Published

    Simple digital only test approach for embedded charge-pump phase-locked loops.

    Burbidge, M. & Richardson, A. M. D., 2001, In: Electronics Letters. 37, 22, p. 1318-1319 2 p.

    Research output: Contribution to Journal/Magazine › Journal article

  13. Published

    Special Issue: Mixed-Technology Testing

    Lubaszewski, M. (Editor), Richardson, A. (Editor) & Su, C. C. (Editor), 07/2009, In: Microelectronics Journal. 40, 7, p. 1041-1041 1 p.

    Research output: Contribution to Journal/Magazine › Editorial › peer-review

  14. Published

    Supply Current Monitoring for Testing CMOS Analog Circuits

    Baturone, I., Huertas, J. L., Solano, S. S. & Richardson, A. M., 1996

    Research output: Other contribution

  15. Published

    Supply current monitoring in cmos circuits for reliability prediction and test.

    Richardson, A. M. D. & Dorey, A. P., 1992, In: Quality and Reliability Engineering International. 8, 6, p. 543-548 6 p.

    Research output: Contribution to Journal/Magazine › Journal article

  16. Published

    System in Package Technology - Design for Manufacture Challenges.

    Richardson, A. M. D., Bailey, C., Dumas, N. & Yannou, J. M., 1/02/2007, In: Circuit World. 33, 1, p. 36-46 11 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  17. Published

    Techniques for automatic on chip closed loop transfer function monitoring for embedded charge pump phase locked loops.

    Burbidge, M. J., Tijou, J. & Richardson, A. M. D., 19/12/2003, Design, Automation and Test in Europe Conference and Exhibition, 2003. p. 496-501 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  18. Published

    Test evaluation for complex mixed signal ICs by introducing layout dependent faults.

    Harvey, R. J. A., Richardson, A. M. D., Bruls, E. M. J. & Baker, K., 1993, Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240. London, p. 6/1-8

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  19. Published

    Test of A/D Converters

    Richardson, A. & Lechner, A., 2008, Test & Diagnostics of Analogue, Mixed Signal & RF Integrated Circuits. Sun, Y. (ed.). Stevenage: IET Press, p. 213-234 22 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter (peer-reviewed)

  20. Published

    Test strategies for electrode degradation in bio-fluidic microsystems.

    Al-Gayem, Q., Honguan, L., Richardson, A. & Burd, N., 02/2011, In: Journal of Electronic Testing. 27, 1, p. 57-68 12 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  21. Published

    Test support strategies for MEMS

    Richardson, A., Rosing, R., Peyton, A. & Dorey, A., 18/06/1999, p. 345-350. 6 p.

    Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review

  22. Published

    Test techniques for embedded charge pump phase-locked loops: problems, current BIST techniques and alternative suggestions.

    Burbidge, M., Richardson, A. M. D. & Lechner, A., 2001, Proceedings of the 7th IEEE international test workshop. p. 97-102 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  23. Published

    Testing high resolution SD ADC’s by using the noise transfer function

    Richardson, A. & De-Venuto, D., 26/05/2004. 0 p.

    Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review

  24. Published

    The application of IDDX test strategies in analogue and mixed signal IC's

    Richardson, A., Bratt, A., Baturone, I. & HUERTAS, J. L., 22/06/1995. 0 p.

    Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review

  25. Published

    The application of neuMOS transistors to enhanced Built-in Self-Test (BIST) and product quality

    Richardson, A. & Nicholson, R., 18/06/1999, p. 257-261. 5 p.

    Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review

  26. Published

    The integration of on-line monitoring and reconfiguration functions into a safety critical automotive electronic control unit.

    Jeffery, C., Cutajar, R., Richardson, A. M. D., Prosser, S., Lickess, M. & Riches, S., 08/2005, In: Journal of Electronic Testing. 21, 4, p. 405-416 12 p.

    Research output: Contribution to Journal/Magazine › Journal article

  27. Published

    The integration of on-line monitoring and reconfiguration functions using IEEE1149.4 into a safety critical automotive electronic control unit.

    Jeffery, C., Cutajar, R., Richardson, A. M. D., Prosser, S., Lickess, M. & Riches, S., 2005, Proceedings of Design, Automation and Test in Europe, 2005.. Vol. 3. p. 153-158 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  28. Published

    Towards a better understanding of failure modes and test requirements of ADCs.

    Lechner, A., Richardson, A. M. D. & Hermes, B., 2001, Proceedings of a conference: automation and test in Europe (DATE ’01). p. 803

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  29. Published

    Towards a health monitor for system in package with MEMS functionality.

    Dumas, N. & Richardson, A., 06/2006. 6 p.

    Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review

  30. Published

    Use of self-calibration data for multifunctional MEMS sensor prognostics

    Khan, H., Tahir, M. I. & Richardson, A. M. D., 08/2016, In: Journal of Micromechanical Systems. 25, 4, p. 761-769 9 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  31. Published

    Using bias superposition to test a thick film conductance sensor.

    Jeffery, C., Zhou, X. & Richardson, A. M. D., 2005, In: Journal of Physics: Conference Series. 15, p. 161-166 6 p.

    Research output: Contribution to Journal/Magazine › Journal article

  32. Published

    VHDL-AMS fault simulation for testing DNA bio-sensing arrays

    Kerkhoff, H. G., Zhang, X., Liu, H., Richardson, A., Nouet, P. & Azais, F., 2005, 2005 IEEE SENSORS. NEW YORK: IEEE, p. 1030-1033 4 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

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