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Professor Andrew Richardson

Professor

  1. 2001
  2. Published

    A failure mode analysis of a 6-bit folding ADCs.

    Lechner, A., Richardson, A. M. D., Burbidge, M. & Hermes, B., 2001, Proceedings of the 7th IEEE international mixed-signal testing workshop (IMSTW ’01). p. 19-23 5 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  3. Published

    Finite element analysis to support component level fault modelling for MEMS.

    Reichenbach, R., Rosing, R., Richardson, A. M. D. & Dorey, A. P., 2001, Proceedings of SPIE design, test, integration and packaging of MEMS symposium. Vol. 4408. p. 147-158 12 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  4. Published

    Generation of component level fault models for MEMS.

    Rosing, R., Reichenbach, R., Richardson, A. M. D. & Dorey, A. P., 2001, Proceedings of the 7th international mixed-signal testing workshop (IMSTW ’01). p. 40-45 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  5. Published

    Short circuit faults in state-of-the-art ADCs – are they hard or soft?

    Lechner, A., Richardson, A. M. D. & Hermes, B., 2001, 10th Asian Test Symposium : proceedings : 19-21 November, 2001, Kyoto, Japan. IEEE Computer Society, p. 417-422 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  6. Published

    Simple digital only test approach for embedded charge-pump phase-locked loops.

    Burbidge, M. & Richardson, A. M. D., 2001, In: Electronics Letters. 37, 22, p. 1318-1319 2 p.

    Research output: Contribution to Journal/MagazineJournal article

  7. Published

    Test techniques for embedded charge pump phase-locked loops: problems, current BIST techniques and alternative suggestions.

    Burbidge, M., Richardson, A. M. D. & Lechner, A., 2001, Proceedings of the 7th IEEE international test workshop. p. 97-102 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  8. Published

    Towards a better understanding of failure modes and test requirements of ADCs.

    Lechner, A., Richardson, A. M. D. & Hermes, B., 2001, Proceedings of a conference: automation and test in Europe (DATE ’01). p. 803

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  9. 2000
  10. Published

    A built-in test solution for a SMART silicon micromachined resonant pressure sensor.

    Jeffery, C., Rosing, R. & Richardson, A. M. D., 2000, IEEE European Test Workshop. IEEE

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  11. Published

    A fault simulation methodology for MEMS.

    Rosing, R., Richardson, A. M. D. & Dorey, A. P., 2000, Proceedings of the design automation and test in Europe conference. Paris: IEEE, p. 476-483 8 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  12. Published

    A fault simulation methodology for MEMS.

    Rosing, R., Richardson, A. M. D. & Dorey, A. P., 2000, Proceedings of the IEE symposium on quality and automation (RESQUA 2000). Penang, Malaysia

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  13. Published

    Applications of mixed signal test strategies to next generation microsystems.

    Jeffery, C., Rosing, R. & Richardson, A. M. D., 2000, Design, modeling, and simulation in microelectronics. 4228 ed. SPIE (Society of Photo-Optical Instrumentation Engineers), p. 21-32 12 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  14. Published

    Design-for-testability for mixed signal and analogue design.

    Richardson, A. M. D. & Lechner, A., 2000, Proceedings of 7th international conference on mixed design of integrated circuits and systems. Poland

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  15. Published

    Fault simulation and modelling of microelectromechanical systems.

    Rosing, R., Lechner, A., Richardson, A. M. D. & Dorey, A. P., 2000, In: IEE Journal on Computing and Control Engineering. 11, 5, p. 242-250 9 p.

    Research output: Contribution to Journal/MagazineJournal article

  16. 1999
  17. Published

    Reconfiguration based built-in self-test for analogue front-end circuits

    Richardson, A., Lechner, A. & Hermes, B., 18/06/1999, p. 243-247. 5 p.

    Research output: Contribution to conference - Without ISBN/ISSN Conference paperpeer-review

  18. Published

    Test support strategies for MEMS

    Richardson, A., Rosing, R., Peyton, A. & Dorey, A., 18/06/1999, p. 345-350. 6 p.

    Research output: Contribution to conference - Without ISBN/ISSN Conference paperpeer-review

  19. Published

    The application of neuMOS transistors to enhanced Built-in Self-Test (BIST) and product quality

    Richardson, A. & Nicholson, R., 18/06/1999, p. 257-261. 5 p.

    Research output: Contribution to conference - Without ISBN/ISSN Conference paperpeer-review

  20. Published

    Fault simulation for MEMS

    Rosing, R., Richardson, A., Dorey, A. & Peyton, A., 1/06/1999, Intelligent and Self-Validating Sensors (Ref. No. 1999/160), IEE Colloquium on. p. 7/1 -7/6

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  21. Published

    A digital partial built-in self-test structure for a high performance automatic gain control circuit

    Lechner, A., Ferguson, J., Richardson, A. & Hermes, B., 1999, DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION 1999, PROCEEDINGS. Borrione, D. & Ernst, R. (eds.). LOS ALAMITOS: IEEE COMPUTER SOC, p. 232-238 7 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  22. 1998
  23. Published

    An Integrated Diagnostic Reconfiguration (IDR) design approach for fault tolerant mixed signal integrated systems

    Richardson, A., Sharif, E. & Dorey, A., 11/06/1998, p. 88-90. 3 p.

    Research output: Contribution to conference - Without ISBN/ISSN Conference paper

  24. Published

    A design for testability study on a high performance automatic gain control circuit.

    Lechner, A., Richardson, A. M. D., Hermes, B. & Ohletz, M., 1998, Proceedings of the 16th IEEE VLSI test symposium. IEEE, p. 376-385 10 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  25. Published

    An approach to realistic fault prediction and layout design for testability in analog circuits

    Prieto, J. A., Rueda, A., Grout, I., Peralias, E., Huertas, J. L. & Richardson, A. M. D., 1998, Design, Automation and Test in Europe, 1998 Proceedings. LOS ALAMITOS: IEEE COMPUTER SOC, p. 905-909 5 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  26. Published

    An approach to realistic fault prediction and layout design for testability in analogue circuits.

    Prieto, J., Richardson, A. M. D., Rueda, A. & Grout, I., 1998, Proceedings of the conference on design, automation and test in Europe. Paris, p. 906-912 7 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  27. Published

    An integrated diagnostic reconfiguration (IDR) technique for fault tolerant mixed signal microsystems.

    Sharif, E., Dorey, A. P. & Richardson, A. M. D., 1998, Proceedings of the IEEE international circuits and systems symposium. IEEE

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  28. Published

    Clock switching: a new design for current test (DcT) method for dynamic logic circuits

    Rosing, R., Richardson, A. M. D., Kerkhoff, A. & Acosta, A., 1998, IDDQ Testing, 1998. Proceedings. 1998 IEEE International Workshop on. IEEE, p. 20-25 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  29. Published

    Design for testability strategies for a high performance gain control circuit.

    Lechner, A., Richardson, A. M. D., Hermes, B. & Perkins, A., 1998, Proceedings of the international IEEE mixed signal test workshop. The Hague

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

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