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Professor Andrew Richardson

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  1. 2005
  2. Published

    Bias superposition: an on-line test strategy for a MEMS based conductivity sensor

    Jeffrey, C., Xu, Z. & Richardson, A., 2005, ETS 2005:10th IEEE European Test Symposium, Proceedings. LOS ALAMITOS: IEEE COMPUTER SOC, p. 88-93 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  3. Published

    Design Considerations for On-line Testing of a Capacitive Accelerometer.

    Jeffery, C., Bunyan, R. J. T., Combes, D., King, D. O. & Richardson, A. M. D., 2005, Proceedings of the 11th IEEE International Mixed-Signals Testing Workshop. p. 220-223 4 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  4. Published

    Investigation into the Use of Alternative Transformation Techniques for High-Resolution A/D Converter Testing.

    Georgopoulos, K., Burbidge, M., Lechner, A. & Richardson, A. M. D., 2005, Proceedings of the IEEE Mixed Signal Test Workshop.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  5. Published

    The integration of on-line monitoring and reconfiguration functions using IEEE1149.4 into a safety critical automotive electronic control unit.

    Jeffery, C., Cutajar, R., Richardson, A. M. D., Prosser, S., Lickess, M. & Riches, S., 2005, Proceedings of Design, Automation and Test in Europe, 2005.. Vol. 3. p. 153-158 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  6. Published

    Using bias superposition to test a thick film conductance sensor.

    Jeffery, C., Zhou, X. & Richardson, A. M. D., 2005, In: Journal of Physics: Conference Series. 15, p. 161-166 6 p.

    Research output: Contribution to Journal/Magazine › Journal article

  7. Published

    VHDL-AMS fault simulation for testing DNA bio-sensing arrays

    Kerkhoff, H. G., Zhang, X., Liu, H., Richardson, A., Nouet, P. & Azais, F., 2005, 2005 IEEE SENSORS. NEW YORK: IEEE, p. 1030-1033 4 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  8. 2004
  9. Published

    Construction of Nonlinear Dynamic MEMS Component Models Using Cosserat Theory.

    Richardson, A., De Masi, B., Rosing, R. & Wang, C., 1/08/2004, In: Analog Integrated Circuits and Signal Processing. 40, 2, p. 117-130 14 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  10. Published

    Testing high resolution SD ADC’s by using the noise transfer function

    Richardson, A. & De-Venuto, D., 26/05/2004. 0 p.

    Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review

  11. Published

    Flexible embedded test solution for high-speed analogue front-end architectures.

    Lechner, A., Burbidge, M. J. & Richardson, A. M. D., 2004, In: IEE Proceedings - Circuits, Devices and Systems. 151, 4, p. 359-369 11 p.

    Research output: Contribution to Journal/Magazine › Journal article

  12. Published

    Motivations and techniques of built in self-test for embedded frequency synthesis systems incorporating charge pump phase-locked loops.

    Burbidge, M., Lechner, A., Bell, G. & Richardson, A. M. D., 2004, IEE proceedings - circuits, devices and systems. 4 ed. Vol. 151. p. 337-348 12 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  13. 2003
  14. Published

    Techniques for automatic on chip closed loop transfer function monitoring for embedded charge pump phase locked loops.

    Burbidge, M. J., Tijou, J. & Richardson, A. M. D., 19/12/2003, Design, Automation and Test in Europe Conference and Exhibition, 2003. p. 496-501 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  15. Published

    Investigations for minimum invasion digital only built in ‘ramp’ based test techniques for charge pump PLLs.

    Burbidge, M. J., Poullet, F., Tijou, J. & Richardson, A. M. D., 08/2003, In: Journal of Electronic Testing. 19, 4, p. 481-490 10 p.

    Research output: Contribution to Journal/Magazine › Journal article

  16. Published

    Construction of nonlinear dynamic MEMS component models using cosserat theory.

    Wang, C., Richardson, A. M. D., Liu, D., Rosing, R., Tucker, R. & De Masi, B., 05/2003, Proceedings of the SPIE design, test, integration and packaging of MEMS symposium. France: Cannes Mandelieu

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  17. Published

    Evaluation and detection of deterministic jitter causes in CP-PLLs due to macro level faults and pre-detection using simple methods.

    Burbidge, M. J., Lechner, A. & Richardson, A. M. D., 2003, In: Proceedings of the 9th IEEE international mixed signal test workshop (IMSTW03). p. 157-164 8 p.

    Research output: Contribution to Journal/Magazine › Journal article

  18. Published

    Investigations into testability improvements on a 16 bit audio sigma-delta ADC through the use of on-chip techniques.

    De Venuto, D., Compagne, E. & Richardson, A. M. D., 2003, Proceedings of IMSTW 2003.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  19. Published

    Investigations of automatic built in transient step response monitoring for embedded second order charge pump phase locked loop frequency synthesizers.

    Burbidge, M. J., Tijou, J. & Richardson, A. M. D., 2003, In: Journal of Electronic Testing.

    Research output: Contribution to Journal/Magazine › Journal article

  20. Published

    Modelling techniques for reliability prediction in MEMS technologies.

    Rosing, R. & Richardson, A. M. D., 2003, Proceedings of the Nanotech 2003 conference.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  21. Published

    Online monitoring for automotive sub-systems using 1149.4.

    Jeffrey, C., Lechner, A. & Richardson, A. M. D., 2003, EPRINTS-BOOK-TITLE. 1.3 ed.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  22. Published

    Re-using IEEE1149.4 as an infrastructure for online monitoring.

    Jeffrey, C., Lechner, A. & Richardson, A. M. D., 2003, Proceedings of the 9th IEEE international mixed signal test workshop (IMSTW03). p. 247-249 3 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  23. 2002
  24. Published

    Investigations of automatic built in transient step response monitoring for embedded second order charge pump phase locked loop frequency synthesizers

    Richardson, A., Tijou, J., Burbidge, M. & Vaid, V., 21/06/2002, p. 23-29. 7 p.

    Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review

  25. Published

    Reconfigurable circuits for fault tolerant systems: factors to consider

    Richardson, A., Jeffrey, C. & Lechner, A., 21/06/2002, p. 215-218. 4 p.

    Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review

  26. Published

    Generation of component level fault models for MEMS

    Rosing, R., Reichenbach, R. & Richardson, A., 2002, In: Microelectronics Journal. 33, 10, p. 861-868 8 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  27. Published

    Generation of MEMS component models using Cosserat symbolic simulations

    Rosing, R., Wang, C., Tucker, R., Richardson, A. & De Masi, B., 2002, SPIE Proceedings: design, test, integration, and packaging of MEMS/MOEMS 2002. Vol. 4755. p. 149-154 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  28. Published

    Investigations for minimum invasion digital only built in ‘ramp’ based test techniques for charge pump PLLs.

    Burbidge, M. J., Tijou, J., Poullet, F. & Richardson, A. M. D., 2002, Proceedings of the Seventh IEEE European Test Workshop, 2002.. IEEE, p. 95-102 8 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  29. 2001
  30. Published

    3DB challenge for DfT, DfM, DOT and BIST integration into analogue and mixed signal ICs.

    Lechner, A., Burbidge, M. J., Richardson, A. M. D. & Hermes, B., 2001, Proceedings of the 2nd Latin-American test workshop (LATW ’01). p. 194-199 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  31. Published

    A failure mode analysis of a 6-bit folding ADCs.

    Lechner, A., Richardson, A. M. D., Burbidge, M. & Hermes, B., 2001, Proceedings of the 7th IEEE international mixed-signal testing workshop (IMSTW ’01). p. 19-23 5 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  32. Published

    Finite element analysis to support component level fault modelling for MEMS.

    Reichenbach, R., Rosing, R., Richardson, A. M. D. & Dorey, A. P., 2001, Proceedings of SPIE design, test, integration and packaging of MEMS symposium. Vol. 4408. p. 147-158 12 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  33. Published

    Generation of component level fault models for MEMS.

    Rosing, R., Reichenbach, R., Richardson, A. M. D. & Dorey, A. P., 2001, Proceedings of the 7th international mixed-signal testing workshop (IMSTW ’01). p. 40-45 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  34. Published

    Short circuit faults in state-of-the-art ADCs – are they hard or soft?

    Lechner, A., Richardson, A. M. D. & Hermes, B., 2001, 10th Asian Test Symposium : proceedings : 19-21 November, 2001, Kyoto, Japan. IEEE Computer Society, p. 417-422 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  35. Published

    Simple digital only test approach for embedded charge-pump phase-locked loops.

    Burbidge, M. & Richardson, A. M. D., 2001, In: Electronics Letters. 37, 22, p. 1318-1319 2 p.

    Research output: Contribution to Journal/Magazine › Journal article

  36. Published

    Test techniques for embedded charge pump phase-locked loops: problems, current BIST techniques and alternative suggestions.

    Burbidge, M., Richardson, A. M. D. & Lechner, A., 2001, Proceedings of the 7th IEEE international test workshop. p. 97-102 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  37. Published

    Towards a better understanding of failure modes and test requirements of ADCs.

    Lechner, A., Richardson, A. M. D. & Hermes, B., 2001, Proceedings of a conference: automation and test in Europe (DATE ’01). p. 803

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  38. 2000
  39. Published

    A built-in test solution for a SMART silicon micromachined resonant pressure sensor.

    Jeffery, C., Rosing, R. & Richardson, A. M. D., 2000, IEEE European Test Workshop. IEEE

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  40. Published

    A fault simulation methodology for MEMS.

    Rosing, R., Richardson, A. M. D. & Dorey, A. P., 2000, Proceedings of the design automation and test in Europe conference. Paris: IEEE, p. 476-483 8 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  41. Published

    A fault simulation methodology for MEMS.

    Rosing, R., Richardson, A. M. D. & Dorey, A. P., 2000, Proceedings of the IEE symposium on quality and automation (RESQUA 2000). Penang, Malaysia

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  42. Published

    Applications of mixed signal test strategies to next generation microsystems.

    Jeffery, C., Rosing, R. & Richardson, A. M. D., 2000, Design, modeling, and simulation in microelectronics. 4228 ed. SPIE (Society of Photo-Optical Instrumentation Engineers), p. 21-32 12 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  43. Published

    Design-for-testability for mixed signal and analogue design.

    Richardson, A. M. D. & Lechner, A., 2000, Proceedings of 7th international conference on mixed design of integrated circuits and systems. Poland

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  44. Published

    Fault simulation and modelling of microelectromechanical systems.

    Rosing, R., Lechner, A., Richardson, A. M. D. & Dorey, A. P., 2000, In: IEE Journal on Computing and Control Engineering. 11, 5, p. 242-250 9 p.

    Research output: Contribution to Journal/Magazine › Journal article

  45. 1999
  46. Published

    Reconfiguration based built-in self-test for analogue front-end circuits

    Richardson, A., Lechner, A. & Hermes, B., 18/06/1999, p. 243-247. 5 p.

    Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review

  47. Published

    Test support strategies for MEMS

    Richardson, A., Rosing, R., Peyton, A. & Dorey, A., 18/06/1999, p. 345-350. 6 p.

    Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review

  48. Published

    The application of neuMOS transistors to enhanced Built-in Self-Test (BIST) and product quality

    Richardson, A. & Nicholson, R., 18/06/1999, p. 257-261. 5 p.

    Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review

  49. Published

    Fault simulation for MEMS

    Rosing, R., Richardson, A., Dorey, A. & Peyton, A., 1/06/1999, Intelligent and Self-Validating Sensors (Ref. No. 1999/160), IEE Colloquium on. p. 7/1 -7/6

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  50. Published

    A digital partial built-in self-test structure for a high performance automatic gain control circuit

    Lechner, A., Ferguson, J., Richardson, A. & Hermes, B., 1999, DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION 1999, PROCEEDINGS. Borrione, D. & Ernst, R. (eds.). LOS ALAMITOS: IEEE COMPUTER SOC, p. 232-238 7 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  51. 1998
  52. Published

    An Integrated Diagnostic Reconfiguration (IDR) design approach for fault tolerant mixed signal integrated systems

    Richardson, A., Sharif, E. & Dorey, A., 11/06/1998, p. 88-90. 3 p.

    Research output: Contribution to conference - Without ISBN/ISSN › Conference paper

  53. Published

    A design for testability study on a high performance automatic gain control circuit.

    Lechner, A., Richardson, A. M. D., Hermes, B. & Ohletz, M., 1998, Proceedings of the 16th IEEE VLSI test symposium. IEEE, p. 376-385 10 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  54. Published

    An approach to realistic fault prediction and layout design for testability in analog circuits

    Prieto, J. A., Rueda, A., Grout, I., Peralias, E., Huertas, J. L. & Richardson, A. M. D., 1998, Design, Automation and Test in Europe, 1998 Proceedings. LOS ALAMITOS: IEEE COMPUTER SOC, p. 905-909 5 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  55. Published

    An approach to realistic fault prediction and layout design for testability in analogue circuits.

    Prieto, J., Richardson, A. M. D., Rueda, A. & Grout, I., 1998, Proceedings of the conference on design, automation and test in Europe. Paris, p. 906-912 7 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  56. Published

    An integrated diagnostic reconfiguration (IDR) technique for fault tolerant mixed signal microsystems.

    Sharif, E., Dorey, A. P. & Richardson, A. M. D., 1998, Proceedings of the IEEE international circuits and systems symposium. IEEE

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  57. Published

    Clock switching: a new design for current test (DcT) method for dynamic logic circuits

    Rosing, R., Richardson, A. M. D., Kerkhoff, A. & Acosta, A., 1998, IDDQ Testing, 1998. Proceedings. 1998 IEEE International Workshop on. IEEE, p. 20-25 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  58. Published

    Design for testability strategies for a high performance gain control circuit.

    Lechner, A., Richardson, A. M. D., Hermes, B. & Perkins, A., 1998, Proceedings of the international IEEE mixed signal test workshop. The Hague

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

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