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Professor Andrew Richardson

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  1. 1992
  2. Published

    Reliability indicators.

    Richardson, A. M. D. & Dorey, A. P., 1992, Third European symposium of reliability of electron devices, failure, physics and analysis (ESREF). Schabisch Gmund, p. 277-285 9 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  3. Published

    Supply current monitoring in cmos circuits for reliability prediction and test.

    Richardson, A. M. D. & Dorey, A. P., 1992, In: Quality and Reliability Engineering International. 8, 6, p. 543-548 6 p.

    Research output: Contribution to Journal/Magazine › Journal article

  4. 1993
  5. Published

    Aspects of current reference generation and distribution for IDDx pass/fail current determination.

    Bratt, A., Harvey, R. J. A., Dorey, A. P. & Richardson, A. M. D., 1993, Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240. London

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  6. Published

    Design-for-test structure to facilitate test vector application with low performance loss in non-test mode.

    Bratt, A., Harvey, R. J. A., Dorey, A. P. & Richardson, A. M. D., 1993, In: Electronics Letters. 29, 16, p. 1438-1440 3 p.

    Research output: Contribution to Journal/Magazine › Journal article

  7. Published

    Test evaluation for complex mixed signal ICs by introducing layout dependent faults.

    Harvey, R. J. A., Richardson, A. M. D., Bruls, E. M. J. & Baker, K., 1993, Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240. London, p. 6/1-8

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  8. 1994
  9. Published

    Analogue Fault Simulation Based on Layout-Dependent Fault Models.

    Harvey, R., Richardson, A. M. D., Baker, K. & Bruls, E., 1994, Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years. Washington, DC, USA: IEEE Computer Society, p. 641-649 9 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  10. Published

    BIST and diagnostics for microsystems.

    Olbrich, T., Bradley, D. A. & Richardson, A. M. D., 1994, Proceedings of the 7th ISATA conference: dedicated conferences on mechatronics and supercomputing applications in the transportation industries. Croydon: Automotive Automation, p. 575-580 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  11. Published

    BIST and diagnostics for safety critical microsystems.

    Olbrich, T., Richardson, A. M. D. & Bradley, D. A., 1994, Proceedings of an ESREF conference. Glasgow, p. 511-518 8 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  12. Published

    Development of class 1 QTAG monitor.

    Bratt, A., Baker, K., Richardson, A. M. D. & Welbers, A., 1994, Proceedings of an international test conference: the next 25 years. IEEE Service Centre

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  13. Published

    Self-test and diagnostics for smart sensors in automotive applications.

    Olbrich, T., Bradley, D. A. & Richardson, A. M. D., 1994, Proceedings of the IEE colloquium on automotive sensors. p. 3/1-4

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  14. 1995
  15. Published

    AC analysis of time discrete systems

    Olbrich, T., Harvey, R. J. A. & Richardson, A. M. D., 1995, In: IEE Seminar Digests. 1995, 192, p. 1 1 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  16. Published

    A design-for-test structure for optimising analogue and mixed signal IC test

    Bratt, A., Richardson, A. M. D., Harvey, R. & Dorey, A. P., 03/1995, European Design and Test Conference. IEEE, p. 24-33 10 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  17. Published

    Defect oriented test development based on inductive fault analysis

    Richardson, A., Kerkhoff, H. G. & Harvey, R., 22/06/1995, p. 2-11. 10 p.

    Research output: Contribution to conference - Without ISBN/ISSN › Conference paper

  18. Published

    The application of IDDX test strategies in analogue and mixed signal IC's

    Richardson, A., Bratt, A., Baturone, I. & HUERTAS, J. L., 22/06/1995. 0 p.

    Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review

  19. Published

    PRACTICAL DFT STRATEGY FOR FAULT-DIAGNOSIS IN ACTIVE ANALOG FILTERS

    VAZQUEZ, D., RUEDA, A., HUERTAS, J. L. & RICHARDSON, A. M. D., 20/07/1995, In: Electronics Letters. 31, 15, p. 1221-1222 2 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  20. 1996
  21. Published

    Defect-oriented vs. chematic-level based fault simulation for mixed-signal ICs.

    Olbrich, T., Perez, J., Grout, I., Richardson, A. & Ferrer, C., 1996, Proceedings of the international test conference 1996. Washington DC, p. 511-520 10 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  22. Published

    Design and self-test for switched-current building blocks

    Olbrich, T. & Richardson, A., 1996, In: IEEE Design and Test of Computers. 13, 2, p. 10-17 8 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  23. Published

    Design-for-test strategies for analogue and mixed-signal integrated circuits

    Olbrich, T., Liberali, V., Maloberti, F. & Richardson, A., 1996, 38TH MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, PROCEEDINGS, VOLS 1 AND 2. Caloba, LP., Diniz, PSR., deQueiroz, ACM. & Watanabe, EH. (eds.). NEW YORK: Eubios Ethics Institute, p. 1139-1144 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  24. Published

    Supply Current Monitoring for Testing CMOS Analog Circuits

    Baturone, I., Huertas, J. L., Solano, S. S. & Richardson, A. M., 1996

    Research output: Other contribution

  25. Published

    Built-In Self-Test in Intelligent Microsystems as a Contributor to System Quality and Performance

    Olbrich, T., Bradley, D. A. & Richardson, A. M. D., 1/06/1996, In: Quality Engineering. 8, 4, p. 601-613 13 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  26. Published

    Built-in self-test and diagnostic support for safety critical microsystems

    Olbrich, T., Richardson, A. M. D. & Bradley, D. A., 07/1996, In: Microelectronics Reliability. 36, 7-8, p. 1125-1136 12 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  27. Published

    Integrated Test Support for Micro- Electro-Mechanical-Systems (MEMS)

    Richardson, A., Vermeiren, W., Straube, B. & Olbrich, T., 19/09/1996, p. 273. 8 p.

    Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review

  28. Published

    Design-for-test (DfT) study on a current mode DAC

    Olbrich, T., Mozuelos, R., Richardson, A. & Bracho, S., 12/1996, In: IEE Proceedings - Circuits, Devices and Systems. 143, 6, p. 374-379 6 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  29. Published

    Editorial: Mixed signal & analogue IC test technology

    Richardson, A. & Dorey, T., 12/1996, In: IEE Proceedings - Circuits, Devices and Systems. 143, 6, p. 357-357 1 p.

    Research output: Contribution to Journal/Magazine › Editorial › peer-review

  30. Published

    Mixed signal test - Techniques, applications and demands

    Baker, K., Richardson, A. M. & Dorey, A. P., 12/1996, In: IEE Proceedings - Circuits, Devices and Systems. 143, 6, p. 358-365 8 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  31. 1997
  32. Published

    A new methodology for IC product quality estimation.

    Olbrich, T., Grout, I., Eben Aimine, Y., Richardson, A. & Contensou, J., 1997, Proceedings of the European design and test conference (ED&TC '97). Paris: IEEE Computer Society Press

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  33. Published

    A new quality estimation methodology for mixed-signal and analogue ICs

    Olbrich, T., Grout, I. A., Aimine, Y. E., Richardson, A. M. & Contensou, J., 1997, European Design and Test Conference, 1997. ED&TC 97. Proceedings . LOS ALAMITOS: I E E E, COMPUTER SOC PRESS, p. 573-580 8 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  34. Published

    Current-mode techniques for self-testing analogue circuits

    Baturone, I., SanchezSolano, S., Richardson, A. M. & Huertas, J. L., 1997, IDDQ Testing, 1997. Digest of Papers., IEEE International Workshop on . Jayasumana, AP. & Tong, C. (eds.). LOS ALAMITOS: I E E E, COMPUTER SOC PRESS, p. 33-37 5 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  35. Published

    Fault-tolerant and self-testable architectures for zero failure electronics

    Richardson, A., Sharif, E. & Betts, W. R., 1997, AUTOMOTIVE ELECTRONICS - AUTOTECH'97. EDMUNDS: MECHANICAL ENGINEERING PUBL, p. 133-142 10 p. (IMechE seminar publication ; 1997-10).

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  36. Published

    Integrating testability into microsystems

    Olbrich, T., Richardson, A., Vermeiren, W. & Straube, B., 02/1997, In: Microsystem Technologies. 3, 2, p. 72-79 8 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  37. Published

    Reconfigurable smart sensors for dependable systems

    Sharif, E., Richardson, A. & Dorey, T., 1/11/1997, Hardware Systems for Dependable Applications (Digest No: 1997/335), IEE Half-Day Colloquium on. IEEE, p. 2/1 -2/6 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  38. 1998
  39. Published

    A design for testability study on a high performance automatic gain control circuit.

    Lechner, A., Richardson, A. M. D., Hermes, B. & Ohletz, M., 1998, Proceedings of the 16th IEEE VLSI test symposium. IEEE, p. 376-385 10 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  40. Published

    An approach to realistic fault prediction and layout design for testability in analog circuits

    Prieto, J. A., Rueda, A., Grout, I., Peralias, E., Huertas, J. L. & Richardson, A. M. D., 1998, Design, Automation and Test in Europe, 1998 Proceedings. LOS ALAMITOS: IEEE COMPUTER SOC, p. 905-909 5 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  41. Published

    An approach to realistic fault prediction and layout design for testability in analogue circuits.

    Prieto, J., Richardson, A. M. D., Rueda, A. & Grout, I., 1998, Proceedings of the conference on design, automation and test in Europe. Paris, p. 906-912 7 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  42. Published

    An integrated diagnostic reconfiguration (IDR) technique for fault tolerant mixed signal microsystems.

    Sharif, E., Dorey, A. P. & Richardson, A. M. D., 1998, Proceedings of the IEEE international circuits and systems symposium. IEEE

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  43. Published

    Clock switching: a new design for current test (DcT) method for dynamic logic circuits

    Rosing, R., Richardson, A. M. D., Kerkhoff, A. & Acosta, A., 1998, IDDQ Testing, 1998. Proceedings. 1998 IEEE International Workshop on. IEEE, p. 20-25 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  44. Published

    Design for testability strategies for a high performance gain control circuit.

    Lechner, A., Richardson, A. M. D., Hermes, B. & Perkins, A., 1998, Proceedings of the international IEEE mixed signal test workshop. The Hague

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  45. Published

    Design for testability strategies for mixed signal and analogue designs: from layout to system.

    Richardson, A. M. D., Lechner, A. & Olbrich, T., 1998, Proceedings of the 5th IEEE international conference on electronics, circuits and systems. Lisbon, p. 425-433 9 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  46. Published

    An Integrated Diagnostic Reconfiguration (IDR) design approach for fault tolerant mixed signal integrated systems

    Richardson, A., Sharif, E. & Dorey, A., 11/06/1998, p. 88-90. 3 p.

    Research output: Contribution to conference - Without ISBN/ISSN › Conference paper

  47. 1999
  48. Published

    A digital partial built-in self-test structure for a high performance automatic gain control circuit

    Lechner, A., Ferguson, J., Richardson, A. & Hermes, B., 1999, DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION 1999, PROCEEDINGS. Borrione, D. & Ernst, R. (eds.). LOS ALAMITOS: IEEE COMPUTER SOC, p. 232-238 7 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  49. Published

    Fault simulation for MEMS

    Rosing, R., Richardson, A., Dorey, A. & Peyton, A., 1/06/1999, Intelligent and Self-Validating Sensors (Ref. No. 1999/160), IEE Colloquium on. p. 7/1 -7/6

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  50. Published

    Reconfiguration based built-in self-test for analogue front-end circuits

    Richardson, A., Lechner, A. & Hermes, B., 18/06/1999, p. 243-247. 5 p.

    Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review

  51. Published

    Test support strategies for MEMS

    Richardson, A., Rosing, R., Peyton, A. & Dorey, A., 18/06/1999, p. 345-350. 6 p.

    Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review

  52. Published

    The application of neuMOS transistors to enhanced Built-in Self-Test (BIST) and product quality

    Richardson, A. & Nicholson, R., 18/06/1999, p. 257-261. 5 p.

    Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review

  53. 2000
  54. Published

    A built-in test solution for a SMART silicon micromachined resonant pressure sensor.

    Jeffery, C., Rosing, R. & Richardson, A. M. D., 2000, IEEE European Test Workshop. IEEE

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  55. Published

    A fault simulation methodology for MEMS.

    Rosing, R., Richardson, A. M. D. & Dorey, A. P., 2000, Proceedings of the design automation and test in Europe conference. Paris: IEEE, p. 476-483 8 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  56. Published

    A fault simulation methodology for MEMS.

    Rosing, R., Richardson, A. M. D. & Dorey, A. P., 2000, Proceedings of the IEE symposium on quality and automation (RESQUA 2000). Penang, Malaysia

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  57. Published

    Applications of mixed signal test strategies to next generation microsystems.

    Jeffery, C., Rosing, R. & Richardson, A. M. D., 2000, Design, modeling, and simulation in microelectronics. 4228 ed. SPIE (Society of Photo-Optical Instrumentation Engineers), p. 21-32 12 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  58. Published

    Design-for-testability for mixed signal and analogue design.

    Richardson, A. M. D. & Lechner, A., 2000, Proceedings of 7th international conference on mixed design of integrated circuits and systems. Poland

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  59. Published

    Fault simulation and modelling of microelectromechanical systems.

    Rosing, R., Lechner, A., Richardson, A. M. D. & Dorey, A. P., 2000, In: IEE Journal on Computing and Control Engineering. 11, 5, p. 242-250 9 p.

    Research output: Contribution to Journal/Magazine › Journal article

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