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Professor Andrew Richardson

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  1. Published

    Test strategies for electrode degradation in bio-fluidic microsystems.

    Al-Gayem, Q., Honguan, L., Richardson, A. & Burd, N., 02/2011, In: Journal of Electronic Testing. 27, 1, p. 57-68 12 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  2. Published

    An on-line monitoring technique for electrode degradation in bio-fluidic microsystems.

    Al-Gayem, Q., Liu, H., Richardson, A. M. D., Burd, N. & Kumar, M., 10/2010, Proceedings of the 2010 IEEE International Test Conference (ITC). Austin, Texas: IEEE, p. 1-10 10 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  3. Published

    An oscillation-based technique for degradation monitoring of sensing and actuation electrodes within microfluidic systems.

    Al-Gayem, Q., Richardson, A., Liu, H. & Burd, N., 02/2011, In: Journal of Electronic Testing. 27, 3, p. 375-387 13 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  4. Published

    Built-in Test Solutions for the Electrode Structures in Bio-Fluidic Microsystems

    Al-Gayem, Q., Liu, H., Richardson, A. & Burd, N., 2009, ETS 2009: EUROPEAN TEST SYMPOSIUM, PROCEEDINGS. LOS ALAMITOS: IEEE COMPUTER SOC, p. 73-78 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  5. Published

    Scanning the strength of a test signal to monitor electrode degradation within bio-fluidic microsystems

    Al-Gayem, Q., Liu, H., Khan, H. & Richardson, A., 2013, On-Line Testing Symposium (IOLTS), 2013 IEEE 19th International. IEEE, p. 133-138 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  6. Published

    Mixed signal test - Techniques, applications and demands

    Baker, K., Richardson, A. M. & Dorey, A. P., 12/1996, In: IEE Proceedings - Circuits, Devices and Systems. 143, 6, p. 358-365 8 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  7. Published

    Current-mode techniques for self-testing analogue circuits

    Baturone, I., SanchezSolano, S., Richardson, A. M. & Huertas, J. L., 1997, IDDQ Testing, 1997. Digest of Papers., IEEE International Workshop on . Jayasumana, AP. & Tong, C. (eds.). LOS ALAMITOS: I E E E, COMPUTER SOC PRESS, p. 33-37 5 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  8. Published

    Supply Current Monitoring for Testing CMOS Analog Circuits

    Baturone, I., Huertas, J. L., Solano, S. S. & Richardson, A. M., 1996

    Research output: Other contribution

  9. Published

    Development of class 1 QTAG monitor.

    Bratt, A., Baker, K., Richardson, A. M. D. & Welbers, A., 1994, Proceedings of an international test conference: the next 25 years. IEEE Service Centre

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  10. Published

    A design-for-test structure for optimising analogue and mixed signal IC test

    Bratt, A., Richardson, A. M. D., Harvey, R. & Dorey, A. P., 03/1995, European Design and Test Conference. IEEE, p. 24-33 10 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  11. Published

    Aspects of current reference generation and distribution for IDDx pass/fail current determination.

    Bratt, A., Harvey, R. J. A., Dorey, A. P. & Richardson, A. M. D., 1993, Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240. London

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  12. Published

    Design-for-test structure to facilitate test vector application with low performance loss in non-test mode.

    Bratt, A., Harvey, R. J. A., Dorey, A. P. & Richardson, A. M. D., 1993, In: Electronics Letters. 29, 16, p. 1438-1440 3 p.

    Research output: Contribution to Journal/Magazine › Journal article

  13. Published

    Motivations and techniques of built in self-test for embedded frequency synthesis systems incorporating charge pump phase-locked loops.

    Burbidge, M., Lechner, A., Bell, G. & Richardson, A. M. D., 2004, IEE proceedings - circuits, devices and systems. 4 ed. Vol. 151. p. 337-348 12 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  14. Published

    Evaluation and detection of deterministic jitter causes in CP-PLLs due to macro level faults and pre-detection using simple methods.

    Burbidge, M. J., Lechner, A. & Richardson, A. M. D., 2003, In: Proceedings of the 9th IEEE international mixed signal test workshop (IMSTW03). p. 157-164 8 p.

    Research output: Contribution to Journal/Magazine › Journal article

  15. Published

    Investigations for minimum invasion digital only built in ‘ramp’ based test techniques for charge pump PLLs.

    Burbidge, M. J., Poullet, F., Tijou, J. & Richardson, A. M. D., 08/2003, In: Journal of Electronic Testing. 19, 4, p. 481-490 10 p.

    Research output: Contribution to Journal/Magazine › Journal article

  16. Published

    Investigations of automatic built in transient step response monitoring for embedded second order charge pump phase locked loop frequency synthesizers.

    Burbidge, M. J., Tijou, J. & Richardson, A. M. D., 2003, In: Journal of Electronic Testing.

    Research output: Contribution to Journal/Magazine › Journal article

  17. Published

    Techniques for automatic on chip closed loop transfer function monitoring for embedded charge pump phase locked loops.

    Burbidge, M. J., Tijou, J. & Richardson, A. M. D., 19/12/2003, Design, Automation and Test in Europe Conference and Exhibition, 2003. p. 496-501 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  18. Published

    Investigations for minimum invasion digital only built in ‘ramp’ based test techniques for charge pump PLLs.

    Burbidge, M. J., Tijou, J., Poullet, F. & Richardson, A. M. D., 2002, Proceedings of the Seventh IEEE European Test Workshop, 2002.. IEEE, p. 95-102 8 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  19. Published

    Simple digital only test approach for embedded charge-pump phase-locked loops.

    Burbidge, M. & Richardson, A. M. D., 2001, In: Electronics Letters. 37, 22, p. 1318-1319 2 p.

    Research output: Contribution to Journal/Magazine › Journal article

  20. Published

    Test techniques for embedded charge pump phase-locked loops: problems, current BIST techniques and alternative suggestions.

    Burbidge, M., Richardson, A. M. D. & Lechner, A., 2001, Proceedings of the 7th IEEE international test workshop. p. 97-102 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  21. Published

    Bit-stream manipulation for SD modulator failure mode analysis.

    Burbidge, M., Georgopoulos, K., Lechner, A. & Richardson, A., 2006, Proceedings of the 11th IEEE European test symposium..

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  22. Published

    Investigations into testability improvements on a 16 bit audio sigma-delta ADC through the use of on-chip techniques.

    De Venuto, D., Compagne, E. & Richardson, A. M. D., 2003, Proceedings of IMSTW 2003.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  23. Published

    Online Testing of MEMS Based on Encoded Stimulus Superposition.

    Dumas, N., Xu, Z., Georgopolis, K., Bunyan, J. & Richardson, A., 12/2008, In: Journal of Electronic Testing. 24, 6, p. 555-566 12 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  24. Published

    Towards a health monitor for system in package with MEMS functionality.

    Dumas, N. & Richardson, A., 06/2006. 6 p.

    Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review

  25. Published

    A novel method for test and calibration of capacitive accelerometers with a fully electrical setup

    Dumas, N., Azaies, F., Mailly, F., Richardson, A. & Nouet, P., 2008, Design and Diagnostics of Electronic Circuits and Systems, 2008. DDECS 2008. 11th IEEE Workshop on . Straube, B., Drutarovsky, M., Renovell, M., Gramata, P. & Fischerova, M. (eds.). LOS ALAMITOS: IEEE COMPUTER SOC, p. 304-309 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  26. Published

    A novel approach for online sensor testing based on an encoded test stimulus

    Dumas, N., Xu, Z., Georgopoulos, K., Bunyan, R. J. T. & Richardson, A., 2007, ETS 2007: 12th IEEE European Test Symposium, Proceedings. LOS ALAMITOS: IEEE COMPUTER SOC, p. 105-110 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  27. Published

    Online sensor testing through superposition of encoded stimulus.

    Dumas, N., Xu, Z., Georgopoulos, K., Bunyan, J. & Richardson, A., 04/2007, Proceedings of the Design, Test, Integration and Packaging of MEMS/MOEMS, Stresa, Lago Maggiore, Italy, 25-27 April 2007.. 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  28. Published

    Behavioural error injection, spectral analysis and error detection for a 4th order single-loop sigma-delta converter using Walsh transforms.

    Georgopoulos, K., Burbidge, M., Lechner, A. & Richardson, A. M. D., 2005, Proceedings of the ETS workshop on Testing of High Resolution Mixed Signal Interfaces.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  29. Published

    Investigation into the Use of Alternative Transformation Techniques for High-Resolution A/D Converter Testing.

    Georgopoulos, K., Burbidge, M., Lechner, A. & Richardson, A. M. D., 2005, Proceedings of the IEEE Mixed Signal Test Workshop.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  30. Published

    An Embedded Test & Health Monitoring Strategy for Detecting and Locating Faults in Aerospace Bus Systems.

    Hannu, J., Koltsov, D., Xu, Z., Richardson, A. & Moilanen, M., 2008, In: Proceedings of the IEEE .

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  31. Published

    Analogue Fault Simulation Based on Layout-Dependent Fault Models.

    Harvey, R., Richardson, A. M. D., Baker, K. & Bruls, E., 1994, Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years. Washington, DC, USA: IEEE Computer Society, p. 641-649 9 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  32. Published

    Test evaluation for complex mixed signal ICs by introducing layout dependent faults.

    Harvey, R. J. A., Richardson, A. M. D., Bruls, E. M. J. & Baker, K., 1993, Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240. London, p. 6/1-8

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  33. Published

    The integration of on-line monitoring and reconfiguration functions into a safety critical automotive electronic control unit.

    Jeffery, C., Cutajar, R., Richardson, A. M. D., Prosser, S., Lickess, M. & Riches, S., 08/2005, In: Journal of Electronic Testing. 21, 4, p. 405-416 12 p.

    Research output: Contribution to Journal/Magazine › Journal article

  34. Published

    Design Considerations for On-line Testing of a Capacitive Accelerometer.

    Jeffery, C., Bunyan, R. J. T., Combes, D., King, D. O. & Richardson, A. M. D., 2005, Proceedings of the 11th IEEE International Mixed-Signals Testing Workshop. p. 220-223 4 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  35. Published

    The integration of on-line monitoring and reconfiguration functions using IEEE1149.4 into a safety critical automotive electronic control unit.

    Jeffery, C., Cutajar, R., Richardson, A. M. D., Prosser, S., Lickess, M. & Riches, S., 2005, Proceedings of Design, Automation and Test in Europe, 2005.. Vol. 3. p. 153-158 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  36. Published

    Using bias superposition to test a thick film conductance sensor.

    Jeffery, C., Zhou, X. & Richardson, A. M. D., 2005, In: Journal of Physics: Conference Series. 15, p. 161-166 6 p.

    Research output: Contribution to Journal/Magazine › Journal article

  37. Published

    Applications of mixed signal test strategies to next generation microsystems.

    Jeffery, C., Rosing, R. & Richardson, A. M. D., 2000, Design, modeling, and simulation in microelectronics. 4228 ed. SPIE (Society of Photo-Optical Instrumentation Engineers), p. 21-32 12 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  38. Published

    A built-in test solution for a SMART silicon micromachined resonant pressure sensor.

    Jeffery, C., Rosing, R. & Richardson, A. M. D., 2000, IEEE European Test Workshop. IEEE

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  39. Published

    Online monitoring for automotive sub-systems using 1149.4.

    Jeffrey, C., Lechner, A. & Richardson, A. M. D., 2003, EPRINTS-BOOK-TITLE. 1.3 ed.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  40. Published

    Re-using IEEE1149.4 as an infrastructure for online monitoring.

    Jeffrey, C., Lechner, A. & Richardson, A. M. D., 2003, Proceedings of the 9th IEEE international mixed signal test workshop (IMSTW03). p. 247-249 3 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  41. Published

    Bias superposition: an on-line test strategy for a MEMS based conductivity sensor

    Jeffrey, C., Xu, Z. & Richardson, A., 2005, ETS 2005:10th IEEE European Test Symposium, Proceedings. LOS ALAMITOS: IEEE COMPUTER SOC, p. 88-93 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  42. Published

    VHDL-AMS fault simulation for testing DNA bio-sensing arrays

    Kerkhoff, H. G., Zhang, X., Liu, H., Richardson, A., Nouet, P. & Azais, F., 2005, 2005 IEEE SENSORS. NEW YORK: IEEE, p. 1030-1033 4 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  43. Published

    Use of self-calibration data for multifunctional MEMS sensor prognostics

    Khan, H., Tahir, M. I. & Richardson, A. M. D., 08/2016, In: Journal of Micromechanical Systems. 25, 4, p. 761-769 9 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  44. Published

    A housekeeping prognostic health management framework for microfluidic systems

    Khan, H., Al-Gayem, Q. & Richardson, A. M. D., 1/06/2017, In: IEEE Transactions on Device and Materials Reliability. 17, 2, p. 438-449 12 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  45. Published

    Initial background search on piezoelectric weight measurement used in urimeter application.

    Koltsov, D. & Richardson, A., 2006.

    Research output: Working paper

  46. Published

    Flexible embedded test solution for high-speed analogue front-end architectures.

    Lechner, A., Burbidge, M. J. & Richardson, A. M. D., 2004, In: IEE Proceedings - Circuits, Devices and Systems. 151, 4, p. 359-369 11 p.

    Research output: Contribution to Journal/Magazine › Journal article

  47. Published

    3DB challenge for DfT, DfM, DOT and BIST integration into analogue and mixed signal ICs.

    Lechner, A., Burbidge, M. J., Richardson, A. M. D. & Hermes, B., 2001, Proceedings of the 2nd Latin-American test workshop (LATW ’01). p. 194-199 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  48. Published

    A failure mode analysis of a 6-bit folding ADCs.

    Lechner, A., Richardson, A. M. D., Burbidge, M. & Hermes, B., 2001, Proceedings of the 7th IEEE international mixed-signal testing workshop (IMSTW ’01). p. 19-23 5 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  49. Published

    Short circuit faults in state-of-the-art ADCs – are they hard or soft?

    Lechner, A., Richardson, A. M. D. & Hermes, B., 2001, 10th Asian Test Symposium : proceedings : 19-21 November, 2001, Kyoto, Japan. IEEE Computer Society, p. 417-422 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  50. Published

    Towards a better understanding of failure modes and test requirements of ADCs.

    Lechner, A., Richardson, A. M. D. & Hermes, B., 2001, Proceedings of a conference: automation and test in Europe (DATE ’01). p. 803

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  51. Published

    A design for testability study on a high performance automatic gain control circuit.

    Lechner, A., Richardson, A. M. D., Hermes, B. & Ohletz, M., 1998, Proceedings of the 16th IEEE VLSI test symposium. IEEE, p. 376-385 10 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  52. Published

    Design for testability strategies for a high performance gain control circuit.

    Lechner, A., Richardson, A. M. D., Hermes, B. & Perkins, A., 1998, Proceedings of the international IEEE mixed signal test workshop. The Hague

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  53. Published

    Investigation into the use of hybrid solutions for high resolution A/D converter testing.

    Lechner, A., Georgopoulos, K., Burbidge, M. & Richardson, A., 12/2006, In: Journal of Electronic Testing. 22, 4-6, p. 359-370 12 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  54. Published

    A digital partial built-in self-test structure for a high performance automatic gain control circuit

    Lechner, A., Ferguson, J., Richardson, A. & Hermes, B., 1999, DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION 1999, PROCEEDINGS. Borrione, D. & Ernst, R. (eds.). LOS ALAMITOS: IEEE COMPUTER SOC, p. 232-238 7 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  55. Published

    Modelling the behaviour of soldier joints for wafer level SIP.

    Liu, H., Strusevich, N., Stoyanov, S., Bailey, C., Richardson, A. M. D., Dumas, N., Yannou, J. M. & Georgel, V., 2006, Proceedings of the 8th IEEE electronics packaging technology conference..

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  56. Published

    Embedded Test & Health Monitoring Strategies for Bio-Fluidic Microystems

    Liu, H., Richardson, A., Harvey, T. G., Ryan, T. & Pickering, C., 2008, ESTC 2008: 2ND ELECTRONICS SYSTEM-INTEGRATION TECHNOLOGY CONFERENCE, VOLS 1 AND 2, PROCEEDINGS. NEW YORK: IEEE, p. 427-433 7 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  57. Published

    Self-testing of micro-electrode array implemented as a bio-sensor

    Liu, H., Dumas, N. & Richardson, A., 1/06/2007, 13th International mixed signals testing workshop and 3rd international GHz/Gbps test workshop. Póvoa de Varzim, Portugal: IEEE Portugal section, p. 166-170 5 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  58. Published

    Design and Test of an Oscillation-based System Architecture for DNA Sensor Arrays

    Liu, H., Kerkhoff, H. G., Richardson, A., Zhang, X., Nouet, P. & Azais, F., 1/06/2005, Proceedings of 11th International Mixed Signal Test Workshop, Cannes, France. France: TIMA Laboratory, p. 1-6 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  59. Published

    Built-in test of electrode degradation of multi-electrode array biosensors

    Liu, H., Dumas, N., Richardson, A., Heal, R. & Kerkhoff, H. G., 1/06/2006, Proceedings of the 12th IEEE International mixed signal testing workshop (IMSTW'06), Edinburgh, United Kingdom. Lancaster, UK: ISLI en Lancaster University, p. 136-141 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  60. Published

    Special Issue: Mixed-Technology Testing

    Lubaszewski, M. (ed.), Richardson, A. (ed.) & Su, C. C. (ed.), 07/2009, In: Microelectronics Journal. 40, 7, p. 1041-1041 1 p.

    Research output: Contribution to Journal/Magazine › Editorial › peer-review

  61. Published

    Guest Editorial

    Lubaszewski, M. (ed.), Richardson, A. (ed.) & Su, C. C. (ed.), 12/2007, In: Journal of Electronic Testing. 23, 6, p. 469-469 1 p.

    Research output: Contribution to Journal/Magazine › Editorial › peer-review

  62. Published

    Failure mechanisms of legacy aircraft wiring and interconnects

    Moffat, B. G., Abraham, E., Desmulliez, M. P. Y., Koltsov, D. & Richardson, A., 06/2008, In: IEEE Transactions on Dielectrics and Electrical Insulation. 15, 3, p. 808-822 15 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  63. Published

    Defect-oriented vs. chematic-level based fault simulation for mixed-signal ICs.

    Olbrich, T., Perez, J., Grout, I., Richardson, A. & Ferrer, C., 1996, Proceedings of the international test conference 1996. Washington DC, p. 511-520 10 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  64. Published

    A new methodology for IC product quality estimation.

    Olbrich, T., Grout, I., Eben Aimine, Y., Richardson, A. & Contensou, J., 1997, Proceedings of the European design and test conference (ED&TC '97). Paris: IEEE Computer Society Press

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  65. Published

    BIST and diagnostics for microsystems.

    Olbrich, T., Bradley, D. A. & Richardson, A. M. D., 1994, Proceedings of the 7th ISATA conference: dedicated conferences on mechatronics and supercomputing applications in the transportation industries. Croydon: Automotive Automation, p. 575-580 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  66. Published

    Self-test and diagnostics for smart sensors in automotive applications.

    Olbrich, T., Bradley, D. A. & Richardson, A. M. D., 1994, Proceedings of the IEE colloquium on automotive sensors. p. 3/1-4

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  67. Published

    BIST and diagnostics for safety critical microsystems.

    Olbrich, T., Richardson, A. M. D. & Bradley, D. A., 1994, Proceedings of an ESREF conference. Glasgow, p. 511-518 8 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  68. Published

    Design-for-test strategies for analogue and mixed-signal integrated circuits

    Olbrich, T., Liberali, V., Maloberti, F. & Richardson, A., 1996, 38TH MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, PROCEEDINGS, VOLS 1 AND 2. Caloba, LP., Diniz, PSR., deQueiroz, ACM. & Watanabe, EH. (eds.). NEW YORK: Eubios Ethics Institute, p. 1139-1144 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  69. Published

    Integrating testability into microsystems

    Olbrich, T., Richardson, A., Vermeiren, W. & Straube, B., 02/1997, In: Microsystem Technologies. 3, 2, p. 72-79 8 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  70. Published

    A new quality estimation methodology for mixed-signal and analogue ICs

    Olbrich, T., Grout, I. A., Aimine, Y. E., Richardson, A. M. & Contensou, J., 1997, European Design and Test Conference, 1997. ED&TC 97. Proceedings . LOS ALAMITOS: I E E E, COMPUTER SOC PRESS, p. 573-580 8 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  71. Published

    Design-for-test (DfT) study on a current mode DAC

    Olbrich, T., Mozuelos, R., Richardson, A. & Bracho, S., 12/1996, In: IEE Proceedings - Circuits, Devices and Systems. 143, 6, p. 374-379 6 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  72. Published

    Built-in self-test and diagnostic support for safety critical microsystems

    Olbrich, T., Richardson, A. M. D. & Bradley, D. A., 07/1996, In: Microelectronics Reliability. 36, 7-8, p. 1125-1136 12 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  73. Published

    Design and self-test for switched-current building blocks

    Olbrich, T. & Richardson, A., 1996, In: IEEE Design and Test of Computers. 13, 2, p. 10-17 8 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  74. Published

    AC analysis of time discrete systems

    Olbrich, T., Harvey, R. J. A. & Richardson, A. M. D., 1995, In: IEE Seminar Digests. 1995, 192, p. 1 1 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  75. Published

    Built-In Self-Test in Intelligent Microsystems as a Contributor to System Quality and Performance

    Olbrich, T., Bradley, D. A. & Richardson, A. M. D., 1/06/1996, In: Quality Engineering. 8, 4, p. 601-613 13 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  76. Published

    An approach to realistic fault prediction and layout design for testability in analogue circuits.

    Prieto, J., Richardson, A. M. D., Rueda, A. & Grout, I., 1998, Proceedings of the conference on design, automation and test in Europe. Paris, p. 906-912 7 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  77. Published

    An approach to realistic fault prediction and layout design for testability in analog circuits

    Prieto, J. A., Rueda, A., Grout, I., Peralias, E., Huertas, J. L. & Richardson, A. M. D., 1998, Design, Automation and Test in Europe, 1998 Proceedings. LOS ALAMITOS: IEEE COMPUTER SOC, p. 905-909 5 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  78. Published

    Finite element analysis to support component level fault modelling for MEMS.

    Reichenbach, R., Rosing, R., Richardson, A. M. D. & Dorey, A. P., 2001, Proceedings of SPIE design, test, integration and packaging of MEMS symposium. Vol. 4408. p. 147-158 12 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  79. Published

    Bringing Multi-Domain Functions to Intelligent Systems through MEMS Technology Platforms – The INTEGRAMplus Access Service.

    Richardson, A., Pickering, C., McNie, M., Reeves, C., Schropfer, G., Knapp, H. & Bosshard, C., 2006, In: MST News (VDI/VDE Technologiezentrum Informationstechnic). 4, p. 38-40 3 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  80. Published

    Design-for-testability for mixed signal and analogue design.

    Richardson, A. M. D. & Lechner, A., 2000, Proceedings of 7th international conference on mixed design of integrated circuits and systems. Poland

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  81. Published

    Design for testability strategies for mixed signal and analogue designs: from layout to system.

    Richardson, A. M. D., Lechner, A. & Olbrich, T., 1998, Proceedings of the 5th IEEE international conference on electronics, circuits and systems. Lisbon, p. 425-433 9 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  82. Published

    Reliability indicators.

    Richardson, A. M. D. & Dorey, A. P., 1992, Third European symposium of reliability of electron devices, failure, physics and analysis (ESREF). Schabisch Gmund, p. 277-285 9 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  83. Published

    Supply current monitoring in cmos circuits for reliability prediction and test.

    Richardson, A. M. D. & Dorey, A. P., 1992, In: Quality and Reliability Engineering International. 8, 6, p. 543-548 6 p.

    Research output: Contribution to Journal/Magazine › Journal article

  84. Published

    System in Package Technology - Design for Manufacture Challenges.

    Richardson, A. M. D., Bailey, C., Dumas, N. & Yannou, J. M., 1/02/2007, In: Circuit World. 33, 1, p. 36-46 11 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  85. Published

    Sensor Testing Through Bias Superposition.

    Richardson, A. M. D., Bunyan, R., Mathias, H. & Nouet, P., 1/05/2007, In: Sensors and Actuators A: Physical. 136, 1, p. 441-455 15 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  86. Published

    A capacitance and optical method for the static and dynamic characterization of micro electro mechanical systems (MEMS) devices.

    Richardson, A. M. D., Ferraris, E., Fassi, I., De Masi, B. & Rosing, R., 1/09/2006, In: Microsystem Technologies. 12, 10-11, p. 1053-1061 9 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  87. Published

    Construction of Nonlinear Dynamic MEMS Component Models Using Cosserat Theory.

    Richardson, A., De Masi, B., Rosing, R. & Wang, C., 1/08/2004, In: Analog Integrated Circuits and Signal Processing. 40, 2, p. 117-130 14 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  88. Published

    INTEGRAMplus : a new European service project providing development platforms for integrated micro-nano technologies and products.

    Richardson, A. M. D., Pickering, C., McNie, M. & Reeves, C. L., 2006, In: MST News (VDI/VDE Technologiezentrum Informationstechnic).

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  89. Published

    MNT needs methodologies and software tools.

    Richardson, A. M. D., Solomon, P. & El-Fatatry, A., 2006, In: MST News (VDI/VDE Technologiezentrum Informationstechnic). 2, p. 16-35 20 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  90. Published

    Guest editorial.

    Richardson, A. M. D., Mir, S. & Cheng, T., 12/2006, In: Journal of Electronic Testing. 22, 4-6, p. 311

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  91. Published

    Editorial: Mixed signal & analogue IC test technology

    Richardson, A. & Dorey, T., 12/1996, In: IEE Proceedings - Circuits, Devices and Systems. 143, 6, p. 357-357 1 p.

    Research output: Contribution to Journal/Magazine › Editorial › peer-review

  92. Published

    Fault-tolerant and self-testable architectures for zero failure electronics

    Richardson, A., Sharif, E. & Betts, W. R., 1997, AUTOMOTIVE ELECTRONICS - AUTOTECH'97. EDMUNDS: MECHANICAL ENGINEERING PUBL, p. 133-142 10 p. (IMechE seminar publication ; 1997-10).

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  93. Published

    Design for Micro and Nano Manufacture; The "PATENT-DfMM Network of Excellence: Modelling and Simulation Cluster

    Richardson, A., Slattery, O. & Rencz, M., 1/04/2006, Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2006. EuroSime 2006. 7th International Conference on. p. 1 -5 5 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  94. Published

    Integrated Test Support for Micro- Electro-Mechanical-Systems (MEMS)

    Richardson, A., Vermeiren, W., Straube, B. & Olbrich, T., 19/09/1996, p. 273. 8 p.

    Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review

  95. Published

    The application of IDDX test strategies in analogue and mixed signal IC's

    Richardson, A., Bratt, A., Baturone, I. & HUERTAS, J. L., 22/06/1995. 0 p.

    Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review

  96. Published

    Defect oriented test development based on inductive fault analysis

    Richardson, A., Kerkhoff, H. G. & Harvey, R., 22/06/1995, p. 2-11. 10 p.

    Research output: Contribution to conference - Without ISBN/ISSN › Conference paper

  97. Published

    An Integrated Diagnostic Reconfiguration (IDR) design approach for fault tolerant mixed signal integrated systems

    Richardson, A., Sharif, E. & Dorey, A., 11/06/1998, p. 88-90. 3 p.

    Research output: Contribution to conference - Without ISBN/ISSN › Conference paper

  98. Published

    Reconfiguration based built-in self-test for analogue front-end circuits

    Richardson, A., Lechner, A. & Hermes, B., 18/06/1999, p. 243-247. 5 p.

    Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review

  99. Published

    The application of neuMOS transistors to enhanced Built-in Self-Test (BIST) and product quality

    Richardson, A. & Nicholson, R., 18/06/1999, p. 257-261. 5 p.

    Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review

  100. Published

    Test support strategies for MEMS

    Richardson, A., Rosing, R., Peyton, A. & Dorey, A., 18/06/1999, p. 345-350. 6 p.

    Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review

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